Product Description:
4156A is the next-generation precision semiconductor parameter analyzer, which integrates functions such as digital scanning parameter analyzer, reliability tester, fault analysis tool, and automatic incoming inspection station. This instrument provides four built-in source / monitor units (SMU), two voltage source units (VSU), and two voltage monitor units (VMU). Full Kelvin sensing is used on each SMU. It can also be expanded with an Agilent HP 41501A SMU equipped with a 0V/1.6A grounding unit and a pulse generator extender. The extender can accept two 100mA/100V SMUs or one 1A/200V SMU, as well as two specially synchronized 40V/200mA/1μs pulse generators.
Product Features:
Wide measurement range and high accuracy: The current measurement range is from 1fA to 1A, with an offset accuracy of 20fA; the voltage measurement range is from 1μV to 200V.
Various measurement modes: Fully automatic IV scanning measurement in DC or pulse mode, which can be extended to 6 SMUs, and also supports step and pulse scanning measurements as well as sampling (time domain) measurements. The time domain measurement interval is 60μs and can be variable up to 10,001 points.
Rich functions: Equipped with synchronous stress/measurement function, with two high-voltage pulse generator units (±40V); has automatic analysis function, which can easily analyze and extract parameters such as hFE and Vth; built-in HP Instrument BASIC, with trigger I/O function, can be synchronized with external instruments, and can be used to build an automatic measurement system.
