产品描述：
4156A 是下一代精密半导体参数分析仪，它集成了数字扫描参数分析仪、可靠性测试仪、故障分析工具和自动进货检测站等功能。该仪器提供四个内置源 / 监视器单元（SMU）、两个电压源单元（VSU）和两个电压监视器单元（VMU），在每个 SMU 上使用全开尔文遥感。还可添加配备 0V/1.6A 接地单元的 Agilent HP 41501A SMU 和脉冲发生器扩展器，扩展器可接受两个 100mA/100V SMU 或一个 1A/200V SMU，以及两个专门同步的 40V/200mA/1μs 脉冲发生器。
产品特点：
测量范围广且精度高：电流测量范围为 1fA 至 1A，偏移精度为 20fA；电压测量范围为 1μV 至 200V。
测量模式多样：采用直流或脉冲模式的全自动 IV 扫描测量，可扩展至 6 个 SMU，还能进行阶梯和脉冲扫描测量以及采样（时域）测量，时域测量间隔为 60μs 可变，最多可达 10,001 个点。
功能丰富：具备同步应力 / 测量功能，配有两个高压脉冲发生器单元（±40V）；拥有自动分析功能，可轻松分析和提取如 hFE 和 Vth 等参数；内置 HP Instrument BASIC，具有触发 I/O 功能，可与外部仪器同步，构建自动测量系统。
Product Description:
4156A is the next-generation precision semiconductor parameter analyzer, which integrates functions such as digital scanning parameter analyzer, reliability tester, fault analysis tool, and automatic incoming inspection station. This instrument provides four built-in source / monitor units (SMU), two voltage source units (VSU), and two voltage monitor units (VMU). Full Kelvin sensing is used on each SMU. It can also be expanded with an Agilent HP 41501A SMU equipped with a 0V/1.6A grounding unit and a pulse generator extender. The extender can accept two 100mA/100V SMUs or one 1A/200V SMU, as well as two specially synchronized 40V/200mA/1μs pulse generators.
Product Features:
Wide measurement range and high accuracy: The current measurement range is from 1fA to 1A, with an offset accuracy of 20fA; the voltage measurement range is from 1μV to 200V.
Various measurement modes: Fully automatic IV scanning measurement in DC or pulse mode, which can be extended to 6 SMUs, and also supports step and pulse scanning measurements as well as sampling (time domain) measurements. The time domain measurement interval is 60μs and can be variable up to 10,001 points.
Rich functions: Equipped with synchronous stress/measurement function, with two high-voltage pulse generator units (±40V); has automatic analysis function, which can easily analyze and extract parameters such as hFE and Vth; built-in HP Instrument BASIC, with trigger I/O function, can be synchronized with external instruments, and can be used to build an automatic measurement system.
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