The Santec STS optical component scanning system is an ideal evaluation tool for optical component research and production sites. It integrates tunable lasers, optical power meters, polarization control units and dedicated software, enabling efficient measurement of the relevant characteristics of optical components.
Characteristics
System composition: It is mainly composed of TSL series tunable lasers, MPM series multi-port power meters, PCU-110 polarization control unit and custom software.
Measurement principle: By simultaneously obtaining the optical power transmitted through the device under test (DUT), and simultaneously referencing the output power of the tunable laser in real time, high-precision measurement is carried out. The system calculates the polarization-dependent loss (PDL) using the Mueller matrix method.
It can achieve high-precision measurement of insertion loss (IL), wavelength-dependent loss (WDL), and PDL characteristics. The IL reproducibility is less than ±0.02 dB, and the WDL reproducibility is ±0.01 dB. It has a scaling algorithm, which enables high wavelength resolution and wavelength accuracy measurements, and can also reduce measurement time. It supports multi-channel measurement and has a graphical user interface and DLL support, making it convenient to configure measurement parameters and data analysis. The WDL measurement dynamic range exceeds 80 dB.
It is mainly used in the research and production process of optical devices to measure and evaluate the IL, WDL, and PDL parameters of various optical devices such as dense wavelength division multiplexing (DWDM) devices, arrayed waveguide grating (AWG), and wavelength-selective switch (WSS).
