Product Overview:
In response to the increasingly miniaturized, lightweight and high-density packaging of electronic products, the insulation failure and ion migration phenomena caused by condensation and moisture absorption have become increasingly prominent. The insulation resistance degradation (ion migration) assessment system, coupled with a high-temperature and high-humidity test chamber, can perform high-precision continuous monitoring and efficiently and simply evaluate the problems related to the lifespan and insulation resistance degradation caused by the ion migration phenomenon. Applicable standards: JPCA-ET04, IPC-TM-650_2.6.3F, IPC-TM-650_2.6.3.1E, IPC-TM-650_2.6.3.4A, IPC-TM-650_2.6.3.6.
Product Features:
The continuous power-on scanning relay is independently developed. It is equipped with international standard measuring instruments and is linked with the environmental test chamber. The operation is more convenient and safer. The stress voltage range is wide: the standard configuration is 100V stress voltage (stress voltage/measurement voltage), and there are also 300V and 500V high-voltage specifications as alternatives. Continuous power-on scanning method: ESPEC's unique scanning action technology. When switching scanning, there is no voltage state. The measurement voltage and bias voltage are both controlled by the same voltage source, allowing for accurate voltage control. Leakage current detection function: It can accurately capture the subtle changes of the ion migration phenomenon in real time, and real-time monitoring of ion migration. Professional statistical software: "E-Graph" can be used to edit and preview the real-time monitored data. Special connection sample fixtures can be selected for easy handling of connection samples and cables, and higher test efficiency.
