Product Description:
The 2470 High Voltage SourceMeter Source Measurement Unit (SMU) instrument brings advanced touch, test, and invention technology to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touch screen technology to make testing intuitive and minimize the learning curve, thereby helping engineers and scientists learn faster, work smarter and invent more easily. With 1100 V and 10 fA capabilities, the 2470 is optimized for characterizing and testing high-voltage, low-leakage devices, materials, and modules such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, and more. These new features, combined with Keithley's decades of expertise in developing high-precision, high-precision SMU instruments, make the 2470 the "instrument of choice" for high-voltage source and low-current measurement applications in laboratories and test stands.
Features:
Wide coverage, 1100v / 1a DC, up to 20w.
10fa measurement resolution
Basic measurement accuracy of 0.012%, 6½ bit resolution
5 inch, high resolution capacitive touch screen GUI
Source and sink (four-quadrant) operations
SCPI and TSP® scripting modes
TSP-Link is used for multi-channel I-V testing
Front panel input jack; Rear panel high voltage input triaxial connection
Built-in context-sensitive help
Front panel USB 2.0 memory I/O port for transferring data, test scripts, and test configurations
