Product description
The single-channel 2635 and dual-channel 2636 are the latest additions to the Gishley 2600 series of multi-channel I-V test solutions. With 1fA measurement resolution, the 2635 and 2636 are optimized for applications requiring low current sources and measurement capabilities, making them ideal for your next generation of semiconductor parametric analysis and test systems. Like the other models in the 2600 series, each measuring just half a rack in size, the 2U instrument combines a precision power supply, a precision current source, a five-and-a-half digit digital multimeter, and a voltage or current pulse generator with measurement, a low-frequency arbitrary waveform generator, electronic load, and trigger control.
Product characteristics
Combine precision power supplies, precise current sources, digital multimeters, arbitrary waveform generators, V or I pulse generators with measurement, electronic load, trigger control - all in one instrument
10,000 readings /s and 5,500 source-measuring points /s to memory provide faster test speeds
Embedded Test Script Processor (TSP™) provides unique system automation for I-V functional testing and two to four times the test throughput of comparable products
The range offers a wide range of dynamic ranges: 1fA to 10A and 1µV to 200V
The TSP-Link™ master/slave connection seamlessly integrates multiple 2600 series system source table channels into one system, making it as simple to program and control as an instrument
The free test script creation software allows you to program custom test functions to help you easily create powerful test scripts
The free LabTracer™ 2.0 software enables curve tracking and quick and easy startup
Each source meter channel is electrically insulated for highly integrated measurement and wiring flexibility
The industry's highest SMU rack density for automated test applications
