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| 选件 | 是否计量 | 发货周期 | 保修时间 | 成色 |
|---|---|---|---|---|
| 否 | 3天 | 12月 | 8成新 | |
| 所在地 | 机身号 | 状态 | 资料下载 | |
| 深圳市 | 完好 |
Keithley 4200-SCS半导体表征系统为半导体器件表征提供直观和复杂的功能，具有9个插槽机箱和集成控制器。通过结合前所未有的测量灵敏度和精度，该器件可确保在200 V时测量精度为0.015% +3 mV，在200 mV时测量精度为0.012% +80µV。
Keithley 4200-SCS半导体表征系统配备了嵌入式基于Windows®的操作系统，同时具有集成的DVD/CD-RW驱动器，允许高容量备份和数据传输。Keithley 4200-SCS是模块化，可配置和可升级的，提供四个核心测量模块，可在九个仪器插槽中混合和匹配，并配置多达七个额外的smu。
特点:
The Keithley 4200-SCS Semiconductor Characterization System provides intuitive and sophisticated capabilities for semiconductor device characterization with 9 slot chassis and an integrated controller. By combining unprecedented measurement sensitivity and accuracy, the device ensures measurement accuracy of 0.015% +3 mV at 200 V and 0.012% +80 µV at 200 mV.
The Keithley 4200-SCS Semiconductor Characterization System is equipped with an embedded Windows®-based operating system while featuring an integrated DVD/CD-RW drive, allowing high-capacity backup and data transfer. The Keithley 4200-SCS is modular, configurable, and upgradeable, offering four core measurement modules to be mixed and matched in the nine instrument slots and configured with up to seven additional SMUs.
Features:
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