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求购安立 MP2100B 采样示波器

浏览次数:1705

紧急求购,资金齐备,坐等发货

产品参数

选件 保修时间 状态 是否计量
不保修 完好
成色 发货周期 所在地 数量
8成新 -- 深圳市 1
预算价格: 电议
更新日期:2021-05-18
联系电话:0755-86016691

*产品描述

用于10 / 40G多通道光模块/设备的研发和制造

BERTWave MP2100B是一款多功能测试仪,内置BERT和可用的采样示波器,支持光学模块评估,包括BER测量,眼罩测试,眼图分析等。


BERT和采样示波器是评估光通信系统使用的光模块所需的测量仪器。先前对光模块(例如QSFP +和SFP +模块)的评估要求提供单独的BERT和采样示波器。但是,BERTWave MP2100B在单个紧凑的18厘米深的机柜中集成了一个支持多达1个至4个通道的BERT以及一个可选的采样示波器,从而大幅降低了设备投资成本并节省了台式空间。此外,BERTWave MP2100B消除了在同时进行BER测量,眼罩测试和眼图分析时更改电缆连接的需求,从而缩短了测量时间。此外,添加SFP +插入端口可支持光学BER测量。


BERTWave MP2100B BERT功能支持BER测量,速度范围为125 Mbit / s至12.5 Gbit / s。其可用的内置4ch BERT选项使配置QSFP +和AOC等多通道模块的测试系统变得容易。此外,除了支持差分信号的BER测量外,它还支持眼罩和眼图测量。


BERTWave MP2100B采样示波器的电接口带宽为25 GHz(典型值),而光接口的带宽为9 GHz(典型值)。此外,最多可内置六个可选的贝塞尔滤波器,用于使用示波器测量光信号。使用这些滤镜,MP2100B支持各种应用的消光比测量,眼罩测试和眼图分析。此外,示波器具有快速采样模式,可确保最快的高速测量。快速采样模式支持高达150 ksample / s的采样速度,比传统模型快1.5倍,并支持省时的高速眼罩测试和眼图分析。


使用抖动分析MX210001A软件可轻松进行多合一的同时抖动分析,眼图和眼罩测量,并且150 ksample / s的采样速度可更有效地利用测量时间。与MATLAB®结合使用可支持对特定信号(例如WDP,TWDP和dWDP波形)进行波形色散测量。


最后,Transmission Analysis MX210002A软件添加了用于分析设备传输的功能(S21增益和相位),以及由线性均衡器,滤波器和加重计算执行的去嵌入波形仿真功能。支持同时进行波形采样和仿真,以及同时进行眼图和眼图模板测量。与MX210001A软件结合使用,还可以同时测量仿真波形的抖动。

特征

  • 内置4通道BERT和采样示波器
  • 同时进行4通道误码率(BER)测量
  • 高质量波形PPG(1 ps rms抖动)
  • 高输入灵敏度(最小输入灵敏度为10 mVp-p)
  • 最高150 ksample / s的高速眼罩测试和眼图分析。
  • 支持差分信号BER测量,眼罩测试和眼图分析
  • 多达六个内置的Bessel过滤器,以提供全功能的应用程序支持
  • 紧凑型(18厘米深)测试仪,用于光模块评估
  • 同时测量BER,抖动,眼图和眼罩
  • 支持WDP测量
  • 计算最佳值,以便同时使用均衡器和强调值进行采样以显示眼图
  • 同时对模拟波形进行眼图,眼图模板和抖动测量

其他要求

For 10/40G Multichannel Optical Module/Device R&D and Manufacturing

The BERTWave MP2100B is an all-in-one test set with built-in BERT and available sampling oscilloscope supporting evaluation of optical modules, including BER measurements, Eye Mask tests, Eye pattern analyses, etc.


A BERT and sampling oscilloscope are required measuring instruments for evaluating optical modules used by optical communications systems. Previous evaluations of optical modules, such as QSFP+ and SFP+ modules, required provision of a separate BERT and sampling oscilloscope. However, the BERTWave MP2100B incorporates a BERT supporting from one up to 4 channels as well as an optional sampling oscilloscope in a single, compact, 18 cm deep cabinet, slashing equipment investment costs and saving bench-top space. In addition, the BERTWave MP2100B reduces measurement times by eliminating the need to change cable connections at simultaneous BER measurements, Eye Mask tests, and Eye pattern analyses. Additionally, adding the SFP+ plug-in port supports optical BER measurements.


The BERTWave MP2100B BERT function supports BER measurements at speeds ranging from 125 Mbit/s to 12.5 Gbit/s; its available built-in 4ch BERT option makes it easy to configure test systems for multichannel modules, such as QSFP+ and AOC. Further, in addition to supporting BER measurements for differential signals, it also supports Eye Mask and Eye pattern Measurements.


The BERTWave MP2100B sampling oscilloscope has a bandwidth of 25 GHz (typ.) for electrical interfaces and a bandwidth of 9 GHz (typ.) for optical interfaces. In addition, up to six optional Bessel filters can be built-in for measuring optical signals using the scope. Using these filters, MP2100B supports extinction ratio measurements, Eye Mask tests and Eye pattern analyses for various applications. Further, the scope has a Fast Sampling Mode to secure the fastest high-speed measurements; sampling speeds of up to 150 ksample/s are supported by Fast Sampling Mode, which is 1.5 times faster than legacy models and supports time-saving high-speed Eye Mask tests and Eye pattern analyses.


Using the Jitter Analysis MX210001A software facilitates easy all-in-one simultaneous Jitter analysis, Eye pattern and Eye Mask measurements and the 150 ksample/s sampling speed makes even more efficient use of measurement time. Combined use with MATLAB® supports waveform dispersion measurements for specific signals, such as WDP, TWDP, and dWDP waveforms.


Last, the Transmission Analysis MX210002A software adds functions for analyzing device transmission (S21 gain and phase), plus a De-Embedded waveform simulation function executed by linear equalizer, filter, and Emphasis calculations. Simultaneous waveform sampling and simulation as well as simultaneous Eye pattern and Eye Mask measurements are supported. Combined use with the MX210001A software also enables simultaneous Jitter measurements of simulated waveforms.


Features

  • Built-in 4ch BERT and sampling oscilloscope
  • Simultaneous 4ch Bit Error Rate (BER) measurements
  • High-quality waveform PPG (1 ps rms Jitter)
  • High-input sensitivity (10 mVp-p minimum input sensitivity)
  • High-speed Eye Mask test and Eye pattern analysis at 150 ksample/s max.
  • Supports differential signal BER measurement, Eye Mask test and Eye pattern analysis
  • Up to six built-in Bessel filters for full-featured application support
  • Compact (18 cm deep) test set for optical module evaluation
  • Simultaneous measurement of BER, Jitter, Eye pattern and Eye Mask
  • Supports WDP measurements
  • Calculates optimum values for sampling simultaneously with equalizer and emphasis values to display Eye Pattern
  • Simultaneous Eye Pattern, Eye Mask and Jitter measurements of simulated waveform

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