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否 | 1-4天 | 12- | 8成新 | |
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深圳市 | 完好 |
AQ6317是一种先进的光谱分析仪,应用范围广泛,包括光源评估、光学器件损耗波长特性测量和波分复用(WDM)系统的波形分析。特别是在1550nm波段,该装置实现了较高的波长精度和波长线性度,可以对波分复用的光学器件进行评价。分析功能使操作简单,可扩展性强。AQ6317包含了安藤最xin的光谱分析仪技术。下一代的参考设备。
特征
●宽50 GHz频谱动态范围内的50 GHz WDM信号高分辨率测量。
●用于WDM和其他光学设备(LD、LED、FBG等)的通用分析功能分析功能
●高波长精度在1550nm波段提供±0.05nm波长精度,波长线性度为±0.01nm,特别适用于高精度损耗波长特性和WDM器件的其他评估。波长标度在空气和真空中都显示。
●同步扫描结合AQ4320可调谐激光源,可通过高速同步扫描实现更高的波长分辨率/更宽的动态范围。
●高波长分辨率达到0.015纳米的波长分辨率
●在600 nm至1750 nm的宽带覆盖范围内具有高灵敏度,高灵敏度允许在-90 dBm下测量光。
●低极化依赖性测量,如光放大器增益,可准确进行,因为极化依赖性被抑制至±0.05 dB。
●高精度,精度在±0.3 dB以内。
●高功率测量:最大+20 dBm(100 mW),即使光放大器的高功率输出也可以在没有光衰减器的情况下直接测量。
9.4英寸彩色液晶显示器
●可测量脉冲光
三个单独的痕迹记忆
Features
● 50 GHz WDM-Signals High-resolution measurement in a wide 50 GHz spectrum dynamic range.
● Versatile analysis functions Analysis functions for WDM and other optical devices (LD, LED, FBG, etc.)
● High wavelength accuracy Provides ±0.05 nm wavelength accuracy in the 1550 nm band, with ±0.01 nm wavelength linearity, making it especially useful for high-precision loss wavelength characteristic and other evaluation of WDM devices. The wavelength scale indicates both in air and in vacuum.
● Synchronous sweep In conjunction with a AQ4320 Tunable Laser Source, much higher wavelength resolution/wide dynamic range can be achieved by high-speed synchronous sweep.
● High wavelength resolution Achieves wavelength resolution of 0.015 nm
● High sensitivity over a wide band Covers from 600 nm to 1750 nm and high sensitivity allow measurement of light at down to -90 dBm.
● Low polarization dependancy Measurements such as gain of optical amplifier can be proceeded accurately because polarization dependency is suppressed as low as ±0.05 dB.
● High-level accuracy Accurate within a ±0.3 dB.
● High power measurement: Max. +20 dBm (100 mW) Even high-power output from an optical amplifier can be measured directly without an optical attenuator.
● 9.4-inch color LCD
● Pulsed light can be measured
● Three individual trace memories
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