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销售圣德科 SPA-100 扫描式光子学分析仪

浏览次数:44

产品参数

选件 是否计量 发货周期 保修时间 成色
2-4周 12月 全新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2024-03-25
联系电话:0755-86016691

* 产品描述

描述:

SPA-100 是 Santec 可调谐激光器的方便光频域反射仪 (OFDR) 附加模块。当配对在一起时,整个系统可以分析最紧凑和最复杂的光学元件,从而产生反射率、透射率、传播损耗和事件距离的结果。
整个系统采用OFDR(光频域反射)技术,能够分析空间域中光纤器件/组件的背向反射和透射特性。该系统产生的迹线类似于 OTDR(光时域反射仪),但具有更高的分辨率和精度。该系统的采样分辨率为 5 um,可以轻松辨别 PIC(光子集成电路)和硅光子 (SiPh) 器件中的结构。

OFDR系统具有广泛的可调谐激光器选择,可高度配置,可在对被测设备具有重要意义的光谱范围内发挥作用。该系统提供 O 波段配置(1260 至 1350nm 范围)和 CL 波段配置(1480 至 1640nm 范围)。无需局限于小波长范围。


特点:
业界最高分辨率反射仪 (<5 μm)
测量光学元件的插入损耗和回波损耗
用于硅光子对准和测试的接近传感
与Santec TSL-570(也可与TSL-550/TSL-710/TSL-770)集成
用于集成 OPM 的馈通端口,用于硅光子器件的主动对准
用于硅光子应用的保偏光纤
随附简易分析软件
WDL 测量扫描范围广(高达 160 nm)
提供 O 波段和 CL 波段配置。
宽动态范围 (>70 dB),用于 WDL 测量,无需增益切换


详细信息

Description:

The SPA-100 is a convenient optical frequency domain reflectometry (OFDR) add-on module to a Santec tunable laser. When paired together, the complete system can analyze the most compact and complex optical components yielding results for reflectance, transmission, propagation loss and distance to events.
The complete system employs OFDR (Optical Frequency Domain Reflectometry) technology enabling it to analyze the back reflection and transmission characteristics of fiber optic devices/components in the spatial domain. The system produces a trace like an OTDR (Optical Time Domain Reflectometer), but with much higher resolution and precision. The system has a sampling resolution of 5 um allowing it to discern structures within PIC (photonic integrated circuits) and silicon photonic (SiPh) devices with ease.

With the wide selection of tunable lasers, the OFDR system is highly configurable to function over the spectrum of importance to the device being measured. The system is offered in an O-band configuration (1260 to 1350nm range) as well as a CL band configuration (1480 to 1640nm range). No need to be limited to a small wavelength range.


Feature:
Industry's highest-resolution reflectometer (<5 μm)
Measure insertion loss and return loss on optical components
Proximity sensing for silicon photonic alignment and testing
Integrates with Santec TSL-570 (also TSL-550/TSL-710/TSL-770)
Feedthrough port for integration of OPM for active alignment of Silicon Photonic Device
Polarization maintaining fiber for Silicon Photonic applications
Easy analysis software included
Wide sweeping range for WDL measurements (up to 160 nm)
Available in O-band and CL-band configurations.
Wide dynamic range (>70 dB) for WDL measurements with no gain switching


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