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销售EXFO FLS-2200 宽带光源

浏览次数:224

产品参数

选件 是否计量 发货周期 保修时间 成色
3天 3天 8成新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2023-11-10
联系电话:0755-86016691

* 产品描述

产品描述:
基于SLED的高功率FLS-2200宽带源系列涵盖了电信应用所需的所有频带。与白色光源相比,它在单模光纤中提供了更宽的光谱范围和更高的光谱密度。高度稳定的FLS-2200是宽带应用、CWDM网络测试、CWDM和PON组件制造和测试以及光纤传感和光谱的理想选择。


两个光源,一个盒子

对于CWDM测试,覆盖S、C和L波段的双SLED选项能够通过极具成本效益的测试设置准确表征光纤链路及其无源组件。将1300nm/1550nm光源用于双窗口耦合器和PON组件。


专为组件测试而设计

EXFO的FLS-2200在频谱上提供了足够的功率来测量高电平插入损耗。通过将FLS-2200与光谱分析仪(OSA)相结合,您可以在开发过程中有效地鉴定组件,或在生产过程中进行合格/不合格测试。


去极化

由于光源是自然偏振的,因此可以利用EXFO的M9700和IQS-9700无源去极化器,将偏振度降低到5%以下。这在测量平均插入损耗或抵消光谱分析器的偏振依赖性时尤其有用。


高光谱密度稳定性

高光谱密度稳定性对于确保测试装置一次又一次地产生准确的测量至关重要。光谱越稳定,就越不经常需要获取参考轨迹。这转化为更高的生产力。在用OSA获取参考迹线之后,可以将其减去所有后续迹线。在系统中没有被测器件(DUT)的情况下,以平均值为中心的结果迹线呈现出源的典型频谱波动。这就是下图所示的内容。


特点:

  • 覆盖所有带
  • 单个SLED:980 nm、1300 nm、1485 nm、1550 nm和1610 nm
  • 双SLED:1300 nm/1550 nm和CWDM范围(1460 nm至1620 nm)
  • 可变输出功率
  • 优化电源稳定性

详细信息

Product Description:
The high-power, SLED-based FLS-2200 Broadband Source family covers all the bands needed for telecommunications applications. It provides a broader spectral range and more spectral density in a singlemode fiber than a white light source. The highly stable FLS-2200 is ideal for broadband applications, CWDM network testing, CWDM and PON component manufacturing and testing, as well as fiber-optic sensing and spectroscopy.


Two Sources, One Box

For CWDM testing, the dual-SLED option, covering the S, C and L bands, enables accurate characterization of fiber links and their passive components, with a very cost-effective test setup. Use the 1300 nm/1550 nm source for dual-window couplers and for PON components.


Designed for Component Testing

EXFO’s FLS-2200 offers enough power along the spectrum to measure high-level insertion loss. By combining the FLS-2200 with an optical spectrum analyzer (OSA), you can efficiently qualify your components during development or perform Pass/Fail testing during production.


Depolarization

As sources are naturally polarized, it is possible to take advantage of EXFO’ s M9700 and IQS-9700 Passive Depolarizers, to bring the degree of polarization to less than 5%. This is especially useful when measuring the average insertion loss, or counteracting the polarization dependency of an optical spectrum ananlyzer.


High Spectral Density Stability

High spectral density stability is essential to ensure that the test setup produces accurate measurements, time and again. The more stable the spectrum, the less often a reference trace has to be acquired. This translates into better productivity. After a reference trace is acquired with the OSA, it can be subtracted to all subsequent traces. With no device under test (DUT) in the system, the resulting traces, centered around the averaged value, present the typical spectral fluctuations of the source. This is what is represented in figure below.


Features:

  • Covers all bands
  • Single SLED: 980 nm, 1300 nm, 1485 nm, 1550 nm and 1610 nm
  • Dual SLED: 1300 nm/1550 nm and CWDM range (1460 nm to 1620 nm)
  • Variable output power
  • Optimized for power stability

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