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销售致茂电子 3112 晶片测试分类机

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产品参数

选件 是否计量 发货周期 保修时间 成色
1-4周 3月 8成新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2022-07-31
联系电话:0755-86016691

* 产品描述

Chroma 3112具备单头与多头之适合量产的PnP 自动化晶片测试分类机,可藉由治具变更处理 各种不同尺寸规格之晶片测试与分类。此设备透 过PnP方式将晶片自晶片盘载入至测试站中,精 确的测试后依据测试结果稳定的放置于分类盘 中。其高效率的模组化设计与精准的机构传动 结构可确保在高速运作下减少Jam Rate的量产要 求,多重检查功能装置可降低待测物发生异常的 损坏。

晶片测试运用此自动化测试分类技术不仅能提升 生产效率、减少人力需求,同时也增加了测试稳 定度及测试良率。此外,其简洁的机台设计更可 节省机台于测试厂之占地面积,帮助客户大幅降 低生产成本。

主要特色:

高信赖度之PnP自动化测试分类机
x4 多盘置入自动测试分类
全方位 (X/Y/Z/θ) 可调式探针座模组
测式座产品堆迭检测
x12 输出分类盘可程式设定输出类别
全程即时良率显示与控制

全程探针接触状态显示 (选配)

详细信息

Chroma 3112 is equipped with single-head and multi-head PnP automated chip test sorting machines suitable for mass production, which can handle various chip test and sorting of different sizes by changing the fixture. This equipment loads the wafers from the wafer tray to the test station through the PnP method, and after precise testing, they are stably placed in the sort tray according to the test results. Its high-efficiency modular design and precise mechanism transmission structure can ensure that the Jam Rate mass production requirements are reduced under high-speed operation, and the multiple inspection function devices can reduce abnormal damage to the test object.

The use of this automated test classification technology for chip testing can not only improve production efficiency and reduce manpower requirements, but also increase test stability and test yield. In addition, its concise machine design can save the machine's floor space in the testing plant and help customers significantly reduce production costs.

main features:

High-reliability PnP automated test classification machine
x4 Multi-disk placement automatic test classification
Omnidirectional (X/Y/Z/θ) adjustable probe holder module
Test seat product stacking inspection
x12 Output classification panel can be programmed to set the output category
Whole-process real-time yield display and control
Full probe contact status display (optional)

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