The Agilent B1520A multi-frequency capacitance measurement unit (MFCMU) in the Agilent B1500A series is backed by Agilent's many years of LCR instrument technology and knowledge. It will further expand the **capacitance measurement function of the Agilent B1500A semiconductor device analyzer. Agilent B1500A integrates the functions of MFCMU and power supply/measurement unit (SMU), can perform basic IV measurement and a variety of capacitance measurements, such as CV, Ct, Cf and quasi-static CV (QS-CV), so it is a comprehensive IV and CV measurement solutions. For semiconductors, carbon nanotubes (CNT), carbon nanowires (CNW), active/passive components, materials, and any electrical devices that require precise IV and CV measurements, the B1520A combines the analysis and data management capabilities of EasyEXPERT software, Very suitable for IV and CV characterization of these devices.
Main features and technical indicators
Support multi-frequency AC impedance measurement, suitable for CV (capacitance-voltage), C-t (capacitance-time) and C-f (capacitance-frequency) measurement
The frequency range is 1 kHz to 5 MHz, the lowest frequency resolution is 1 mHz
SMU and SCUU (SMU CMU unified unit) provide 25 V built-in DC bias and 100 V DC bias
SCUU supports automatic connection changes for fast and accurate IV and CV measurements
Signal level up to 250 mVrms
1001 sweep points in CV, C-f and C-t measurement
Supported measurements: Cp-G, Cp-D, Cp-Q, Cp-Rs, Cs-Rs, Cs-D, Cs-Q, Lp-G, Lp-D, Lp-Q, Lp-Rs, Ls- Rs, Ls-D, Ls-Q, RX, GB, Z-θ, Y-θ
By integrating current-voltage (IV) and CV measurements, you can have confidence in capacitance-voltage (CV) measurement results