主动温度控制 防止温度变化可能引起激光二管主输出波长发生变化,导致出现信号重叠和串扰问题。
50W TEC 控制器 比其他低功耗解决方案提供更高的测试速度和更宽的温度设定值范围。
全数字 P-I-D 控制 提供更高的温度稳定性,并可通过简单的固件变化轻松升级。
适用于热控制环路的自动调谐功能 (2510-AT) 无需反复试验即可确定 P、I 和 D 系数的组合。
宽温度设定值范围(–50°C 至 +225°C)以及高设定值分辨率 (±0.001°C) 和稳定性 (±0.005°C) 能够满足大部分冷却光学元器件和子装配件生产测试的测试要求。
兼容于多种温度传感器输入 — 热敏电阻、RTD 和 IC 传感器 适合常用于各类激光二管模块的温度传感器类型。
交流欧姆测量功能 验证 TEC 器件的完整性。
适用于热反馈元件的四线开路/短路引线检测 消除引线电阻测量值误差,减少假故障或设备损坏的可能性。
Active temperature control prevents the temperature change that may cause the main output wavelength of the laser diode to change, leading to signal overlap and crosstalk problems.
The 50W TEC controller provides higher test speed and wider temperature setting range than other low-power solutions.
Full digital P-I-D control provides higher temperature stability and can be easily upgraded through simple firmware changes.
The automatic tuning function (2510-AT) for thermal control loops can determine the combination of P, I, and D coefficients without trial and error.
Wide temperature setting range (-50°C to +225°C) and high setting resolution (±0.001°C) and stability (±0.005°C) can meet most cooling optical components and sub-assemblies Test requirements for production testing.
Compatible with a variety of temperature sensor inputs — thermistor, RTD and IC sensors. Suitable for temperature sensor types commonly used in various laser diode modules.
The AC ohm measurement function verifies the integrity of the TEC device.
Suitable for four-wire open/short lead detection of thermal feedback components. Eliminate errors in lead resistance measurement and reduce the possibility of false faults or equipment damage.
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