描述：
National Instruments PXI-5124示波器
的NI的PXI-5124的高分辨率数字化仪具有各种配置，包括：8 MB /通道示波器（型号：778757-01），32 MB /通道示波器（型号：778757-02），256 MB /通道示波器（零件号：778757-03），512 MB /通道示波器（零件号：778757-04）。
该示波器突出显示了两个200 MS / s同时测试的数据源通道，这些通道具有12位分辨率，150 MHz数据传输，并在较小的3U PXI模块中为每个路由提供多达512 MB的内存。在NI PXI-5124采用快速PCI总线和NI MITE ASIC的分散聚集总线主控移动速度信息给PC达100倍更快比常规的仪器接口。这有助于大大减少一般测试时间。借助PXI-5124的同步和存储核心（SMC）设计，用户可以利用信号发生器和高级波形发生器/分析仪来制作混合信号框架，或者制造具有通道之间亚纳秒级同步的高通道数数字化仪。
为了利用内部采样时钟实现不同于200 MS / s的检查速率，NI PXI-5124粉碎了所检查的信息。当用户将检查速率设置为50 MS / s时，NI PXI-5124仅将从ADC获得的四个采样中的一个存储到本地可用内存中。的PXI-5124可以以200个评分测试/ N MS / S，其中n是整数在1和216附近的激励- 1。由于这种模式不改变发送到的ADC时钟的复发，它考虑到用户安排的成功检查率使其发出一个采样时钟。
Description:
National Instruments PXI-5124 Oscilloscope
The National Instruments PXI-5124 high-resolution digitizer has various configurations, including: 8 MB/channel Oscilloscope (Part Number: 778757-01), 32 MB/channel Oscilloscope (Part Number: 778757-02), 256 MB/channel Oscilloscope (Part Number: 778757-03), 512 MB/channel Oscilloscope (Part Number: 778757-04).
This oscilloscope highlights two 200 MS/s simultaneous tested data source channels with 12-bit resolution, 150 MHz data transmission, and up to 512 MB of memory for each route in a smaller 3U PXI module. The NI PXI-5124 uses the rapid PCI bus and the scatter-gather bus mastering of the NI MITE ASIC to move information to the PC at speeds up to 100 times speedier than customary instrument interfaces. This helps drastically diminish general test time. With the Synchronization and Memory Core (SMC) design of the PXI-5124, the user can make mixed signal frameworks utilizing signal generators and advanced waveform generator/analyzers or manufacture a high-channel-count digitizer with sub-nanosecond synchronization between channels.
To accomplish inspecting rates different than 200 MS/s when utilizing the inner sample clock, the NI PXI-5124 crushes the examined information. When the user sets an inspecting rate of 50 MS/s, the NI PXI-5124 just stores one out of each four samples it gets from the ADCs to locally available memory. The NI PXI-5124 can test at rates of 200/n MS/s, where n is a whole number an incentive in the vicinity of 1 and 216 – 1. Since this model does not change the recurrence of the clock sent to the ADCs, it makes a sample clock for send out considering the successful examining rate that the user has arranged.
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