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| 选件 | 是否计量 | 发货周期 | 保修时间 | 成色 |
|---|---|---|---|---|
| 否 | 3天 | 12月 | 9成新 | |
| 所在地 | 机身号 | 状态 | 资料下载 | |
| 深圳市 | 完好 |
Additional Features:
The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.
High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.
Additional Features:
The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.
High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.
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