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销售爱德万 R3760 板状网络分析器

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产品参数

选件 是否计量 发货周期 保修时间 成色
5天 90天 8成新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2026-01-01
联系电话:0755-86016691

* 产品描述

产品描述
ADVANTEST R3760 是一款板卡式矢量网络分析仪,专为高频电子元件及无线通信设备的频率特性测试设计。其核心功能是通过嵌入个人计算机的PCI插槽,将PC转化为高性能网络分析设备,覆盖 300 MHz至6 GHz 频段,支持传输(S21)和反射(S11)参数测量。该设备适用于天线、滤波器、晶体振荡器等元件的研发与生产测试,尤其满足无线局域网(Wi-Fi)、蓝牙、RFID等便携式设备的低成本、高集成度测试需求。
主要特点
  • 板卡化设计:小巧机身嵌入PCI插槽,节省空间达传统设备1/3,显著降低实验室或产线部署成本。
  • 宽频段覆盖:支持 300 MHz至6 GHz 频段,满足高频元件(如陶瓷振荡器、音叉型晶体振荡器)的测试需求。
  • 高精度测量:输出电平范围 0 dBm至-10 dBm(≤3 GHz),分辨率0.1 dB;输入噪声水平低至 -70 dBm(RBW 1 kHz),确保信号纯净度。
  • 多通道并行测试:4个独立测量通道,支持多参数同步分析,提升测试效率。
  • 快速扫描与分段测试:最小扫描时间 50 μs/点(RBW 15 kHz),支持自定义频段分段扫描,灵活适配复杂测试场景。
  • 低功耗与扩展性:功耗低于 20 W,单台PC最多支持 8台并行驱动,满足大规模产线自动化测试需求。
  • 兼容性与软件支持:标配并行I/O接口,提供 LabVIEW/VB驱动软件,便于用户开发定制化测试程序。

详细信息

Product Description of ADVANTEST R3760
The ADVANTEST R3760 is a board-type vector network analyzer designed for frequency characteristic testing of high-frequency electronic components and wireless communication devices. By embedding into a PCI slot of a personal computer, it transforms the PC into a high-performance network analysis system, covering a frequency range of 300 MHz to 6 GHz and supporting transmission (S21) and reflection (S11) parameter measurements. This device is ideal for R&D and production testing of antennas, filters, crystal oscillators, and other components, particularly meeting the low-cost, high-integration testing requirements of portable devices such as Wi-Fi, Bluetooth, and RFID systems.
Key Features of ADVANTEST R3760
  • Board-Level Design: Compact form factor fits into PCI slots, reducing space requirements by 1/3 compared to traditional equipment and significantly lowering deployment costs in labs or production lines.
  • Broad Frequency Coverage: Supports 300 MHz to 6 GHz, addressing testing needs for high-frequency components like ceramic oscillators and tuning fork crystal oscillators.
  • High-Precision Measurement: Output level range of 0 dBm to -10 dBm (≤3 GHz) with 0.1 dB resolution; input noise level as low as -70 dBm (RBW 1 kHz) ensures signal purity.
  • Multi-Channel Parallel Testing: Four independent measurement channels enable simultaneous multi-parameter analysis, enhancing testing efficiency.
  • Fast Scanning and Segmented Testing: Minimum scan time of 50 μs/point (RBW 15 kHz) with support for custom frequency segment scanning, adapting flexibly to complex testing scenarios.
  • Low Power Consumption and Scalability: Power consumption below 20 W, with support for up to 8 units operating in parallel on a single PC, meeting large-scale production line automation testing demands.
  • Compatibility and Software Support: Standard parallel I/O interface with LabVIEW/VB driver software provided, facilitating user-developed customized testing programs.

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