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销售安立 MT8850A 蓝牙综合测试仪

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产品参数

选件 是否计量 发货周期 保修时间 成色
否 5天 90天 8成新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2025-11-22
联系电话:0755-86016691

* 产品描述

产品描述
安立 MT8850A 是一款面向蓝牙技术研发、生产及认证环节的高性能综合测试仪器,可全面覆盖蓝牙经典版(BR/EDR)与低功耗版(BLE)的测试需求。其核心定位是为通信设备制造商提供一体化测试解决方案,通过集成多维度测试功能,帮助用户简化测试流程、提升测试效率,同时确保产品符合蓝牙技术联盟(SIG)的标准规范,适用于芯片、模块、终端设备等全产业链的测试场景。
产品特点
覆盖全协议版本:支持蓝牙 1.2 至 5.3 全版本协议,包括 BR/EDR、BLE 及双模(Dual Mode)设备测试,无需更换测试平台即可满足不同产品的测试需求。
集成多测试功能:内置射频(RF)性能测试、基带信号分析、协议一致性测试及音频性能测试功能,可一站式完成发射功率、接收灵敏度、调制精度、协议兼容性等关键指标验证。
高测试精度与效率:射频测试动态范围达 -120dBm 至 +23dBm,测量误差小于 ±0.5dB,且支持自动化测试脚本编写,单台设备测试耗时可缩短 30% 以上。

详细信息

Product Description
The Anritsu MT8850A is a high-performance comprehensive testing instrument specifically designed for the research, production and certification stages of Bluetooth technology. It can fully meet the testing requirements of both Bluetooth Classic (BR/EDR) and Low Power Version (BLE). Its core positioning is to provide an integrated testing solution for communication equipment manufacturers. By integrating multi-dimensional testing functions, it helps users simplify the testing process, improve testing efficiency, and ensure that the products comply with the standards and specifications of the Bluetooth Special Interest Group (SIG), applicable to testing scenarios in the entire industry chain including chips, modules, and terminal devices.
Product features
Covering all protocol versions: Supports the full range of Bluetooth 1.2 to 5.3 protocol versions, including BR/EDR, BLE, and dual-mode (Dual Mode) device testing. No need to change the test platform to meet the testing requirements of different products.
Integrating multiple testing functions: Built-in RF (Radio Frequency) performance testing, baseband signal analysis, protocol consistency testing, and audio performance testing functions can complete the verification of key indicators such as transmission power, receiving sensitivity, modulation accuracy, and protocol compatibility in one step.
High test accuracy and efficiency: The RF test dynamic range reaches -120dBm to +23dBm, with a measurement error of less than ±0.5dB. And it supports the writing of automated test scripts, reducing the testing time of a single device by more than 30%.

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