Product Overview:
The new 2601B-PULSE system SourceMeter 10 μs pulse generator /SMU instrument, which adopts PulseMeter™ technology, is an industry-leading high-current/high-speed pulse generator with all the functions of a traditional SMU. This new type of pulse generator provides leading 10 A current pulse output at 10 V voltage, with a minimum pulse width of 10 μs. It is highly suitable for testing vertical cavity surface-emitting lasers (VCsels) for LIDAR and facial recognition, leds for lighting and displays, semiconductor device characterization, surge protection testing, etc. The pulse generator is equipped with a dual 18-bit digitizer with a sampling rate of 1 MHZ per second (MS/s), allowing for the simultaneous collection of pulse current and voltage waveforms without the need for separate instruments.
2601B-PULSE is a powerful solution that can significantly improve the analytical efficiency of applications ranging from desktop characterization to highly automated pulse I-V production testing. For automation system applications, the Test Script processor (TSP®) of 2601B-PULSE can run complete test programs within the instrument to achieve the best throughput in the industry. In larger multi-channel applications, the Keithley TSP-Link® technology, when used in combination with the TSP technology, enables parallel testing of each pin of the high-speed pulse generator /SMU. Since 2601B-PULSE provides complete isolation without the need for a host, it can be easily reconfigured and redeployed as the test application develops.
Features:
Channel: 1
Maximum current source/measurement range: 10 A
Maximum voltage source/measurement range: 40 V
Measurement resolution (current/voltage) : 100 fA / 100 nV
Power
Pulse generator: 100 W instantaneous
SMU: 200 W instantaneous
Industry-leading 10 A @ 10 V, 10 microsecond pulse output
No tuning required; Suitable for inductive loads up to 3 μH
Dual 1 MHZ sampling/second digitizer, used for high-speed I/V pulse measurement (pulse generator function only)
The DC capacity is as high as ±40 V @ ±1.0 A, 40 W
TSP technology embeds the complete test program into the instrument to achieve first-class system-level throughput
The TSP-Link extension technology enables multi-channel parallel testing without the need for a host
USB 2.0, LXI Core, GPIB, RS-232 and digital I/O interface
