Product Description:
The D8 DISCOVER is a flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for structural characterization of a variety of materials ranging from powders, amorphous and polycrystalline materials to epitaxial multilayer films under ambient and non-ambient conditions.
Features:
Phase identification and quantification, structure determination and refinement, micro-strain and grain size analysis,
X-ray reflection, grazing-incidence diffraction (GID), in-plane diffraction, high-resolution XRD, GISAXS, GI stress analysis, crystal orientation analysis
Residual stress analysis, texture and polarography, micro-area X-ray diffraction, Wide-angle X-ray Scattering (WAXS),
Full scattering analysis: Bragg Diffraction, pair Distribution Function (PDF), Small Angle X-ray Scattering (SAXS)
