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| 选件 | 是否计量 | 发货周期 | 保修时间 | 成色 |
|---|---|---|---|---|
| 否 | 5天 | 90天 | 二手 | |
| 所在地 | 机身号 | 状态 | 资料下载 | |
| 深圳市 | 完好 |
产品概述：
Keithley 4200-SCS（半导体表征系统）是用于半导体器件和材料的 I-V 表征的集成系统。根据配置，该仪器具有两个标准 SMU（分辨率为 1pA）和两个预放大 SMU（分辨率为 100fA）。当与地面单元 （GRNU） 结合使用时，这提供了执行多达五个终端设备测量的能力。4200-SCS 是执行晶体管表征和参数测量的理想仪器。它还可用于二极管表征。高级用户可以将仪器的配置灵活性、极高的灵敏度用于其他目的，例如压力测试和准静态 C-V 测量。
4200-SCS 通过便捷的用户界面提供真正出色的灵敏度和性能。但是，强烈建议用户注意，成功的低电流测量（例如，低于 1pA）需要适当的夹具并熟练掌握屏蔽和保护技术。因此，鼓励用户花时间研究设备操作手册，并仔细考虑他们的样品配置和实验条件。不做出此承诺将导致设备性能受损和无法获得最佳结果。所有测试配置中的一个重要考虑因素是测试敏感度和测试时间之间的权衡。极低电流测试受物理定律（散粒噪声）的限制，精度是通过较长的测试（积分）时间实现的。
仪器的输入通过低噪声三轴电缆提供。为了充分利用性能，应将测试夹具配置为尽可能靠近被测设备 （DUT） 的受保护连接。
MTW 工程师可以通过 GUI 为被测器件 DUT 夹具和编程提供建议和帮助。希望在不全面了解其操作的情况下利用仪器功能的用户应预见到需要购买帮助。
对于在可用操作范围内要求最高灵敏度的用户，该仪器是绝佳的选择。
技术特征：
台式电压、电流测量
电压至 200v
电流至 100mA
图形用户界面设置和操作
基于 GPIB 的自动数据采集 - 需要高级编程技能
Product Overview:
The Keithley 4200-SCS (Semiconductor Characterization System) is an integrated system for I-V characterization of semiconductor devices and materials. Depending on the configuration, the instrument has two standard SMUs (resolution 1pA) and two pre-amplified SMUs (resolution 100fA). When combined with a ground unit (GRNU), this provides the ability to perform up to five end-device measurements. The 4200-SCS is an ideal instrument for performing transistor characterization and parameter measurement. It can also be used for diode characterization. Advanced users can use the instrument's flexible configuration and extremely high sensitivity for other purposes, such as pressure testing and quasi-static C-V measurements.
The 4200-SCS delivers truly outstanding sensitivity and performance through a convenient user interface. However, users are strongly advised to note that successful low current measurements (e.g., below 1pA) require appropriate clamps and proficiency in shielding and protection techniques. Therefore, users are encouraged to take the time to study the equipment operating manual and carefully consider their sample configuration and experimental conditions. Failure to make this commitment will result in compromised equipment performance and less than optimal results. An important consideration in all test configurations is the trade-off between test sensitivity and test time. Very low current testing is limited by the laws of physics (shot noise), and accuracy is achieved through a long test (integration) time.
Input to the instrument is provided via a low noise triaxial cable. To maximize performance, the test fixture should be configured as close as possible to the protected connection of the device under test (DUT).
MTW engineers can provide advice and assistance with DUT fixtures and programming of the device under test through the GUI. Users who wish to take advantage of the instrument's features without a full understanding of its operation should anticipate the need for purchase assistance.
This instrument is an excellent choice for users who require the highest sensitivity within the available operating range.
Technical features:
Benchtop voltage and current measurement
Voltage up to 200v
Current up to 100mA
Graphical user interface Settings and operations
Automatic data acquisition based on GPIB - requires advanced programming skills
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