Product Description:
The TUX-3300N is a microscope inspection device designed for high-precision, high-resolution X-ray imaging. It combines advanced X-ray technology and precision mechanical structure to provide users with a non-destructive inspection method for the detection and analysis of various micro electronic components, semiconductor devices, materials science and biomedical fields.
Features:
The use of basket body design, improve the usability
High-speed inspection mechanical response function and semi-automatic inspection function
The maximum tilt Angle of the detector is 60°, the size of the stage is 400mm in diameter