Condition: Used Test Equipment
DC I-V, C-V, and Pulse in One Test Environment
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Intuitive, point-and-click Windows®-based environment
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Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
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C-V instrument makes C-V measurements as easy as DC I-V
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Pulse and pulse I-V capabilities for advanced semiconductor testing
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Scope card provides integrated scope and pulse measure functionality
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Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
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Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
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Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
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Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Keysight 81110 pulse generators
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Includes software drivers for leading analytical probers
