Product Description:
The Keysight B1500A Semiconductor Parameter Analyzer is an all-in-one device characterization analyzer designed for comprehensive semiconductor testing. This versatile instrument supports a variety of measurement technologies, including IV, CV, pulse/dynamic IV, and more, making it ideal for semiconductor test applications. Host and plug-in modules offer unmatched flexibility to characterize a wide range of electronic devices, materials, semiconductors, active/passive components, and more.
The source/measurement unit (SMU), such as the Keysight B1511A (Agilent), is the key measurement module of the Agilent/Keysight B1500A semiconductor device parameter analyzer. SMU integrates voltage/current source and measurement functions into a single module, enabling accurate DC current-voltage (IV) measurements at resolutions as low as fA / μV. If you need higher measurement performance, you can extend the low current measurement performance to the sub-fA level with the optional ASU (Atto Sensing Switching Unit).
Features:
Switch between CV and IV measurements without rewiring
Capture ultrafast transient phenomena that cannot be captured by other conventional test instruments
Detects multi-frequency AC capacitance measurements in the range of 1 kHz to 5 MHz
MPSMU - Range up to 100 V/100 mA, 4 quadrant operation
Minimum measurement resolution 10 fA / 0.5 μV
