Product Description:
The Type 4225-PMU ultra-fast I-V module is the latest addition to the growing family of instrument options for type 4200-SCS semiconductor characterization systems. It integrates ultra-fast voltage waveform generation and signal observation capabilities into the 4200-SCS's already robust test environment to provide unprecedented I-V test performance, greatly expanding the system's material, device, and process characterization potential. Just as importantly, it makes ultra-fast I-V sources and measurements as simple as DC measurements with a traditional high-resolution source measurement unit (SMU). Each plug-in 4225-PMU module provides two integrated source and measurement channels, but occupies only one slot in the 9-slot chassis of the 4200-SCS model. Unlike competing solutions, each channel of the model 4225-PMU combines high-speed voltage output (pulse widths ranging from 60 nanoseconds to DC) with synchronous current and voltage measurements.
Features:
With programmable timing, from 60ns to DC (10ns step size), it provides high-speed voltage output capability
Simultaneous measurement of current (I) and voltage (V) at sampling rates of up to 200 trillion samples per second (MS/s) ensures accurate and high speed measurements
Two voltage source ranges (±10V or ±40V) and four current measuring ranges (800mA, 200mA, 10mA, 100µA) are available to meet different test requirements
