Product Description:
The Keithley 4200-SCS is a laboratory-level semiconductor characteristic analysis system. The Keithley 4200-SCS semiconductor characteristic analysis system is mainly used for device I-V/C-V characteristic measurements, reliability and durability tests, etc. This system supports two-terminal, three-terminal, and four-terminal electronic device testing, and is suitable for wafer testing requirements. It has an embedded PC built-in and operates in a Windows operating environment. It is equipped with an automatic recording system and a click-style interactive interface to accelerate data acquisition. It is configured with a hard drive larger than 120GB, USB interfaces, and Ethernet interfaces. The system can integrate various modules, such as the pulse I-V function module, the Stress/Measure reliability test module, etc. It can also be connected to the Keithley KITE environment control peripheral devices and is compatible with the Cascade Microtech Summit 12K series probe station.
Product Features:
High precision and high resolution: The unique remote preamplifier can extend the resolution of the SMU to 0.1 fA. When the optional 4200-PA remote front-end amplifier is configured, the current measurement resolution can be as low as 10 aA, meeting the requirements for ultra-low current measurement, such as determining the gate leakage current of FETs.
Rich and diverse functions: The core uses the world-class source measurement unit (SMU), which can provide voltage or current, and simultaneously measure voltage and current with high resolution and accuracy, achieving I-V synchronous measurement. It also has ultra-low frequency C-V measurement technology, allowing for ultra-low frequency capacitance voltage measurement without an LCR meter or capacitance module. Additionally, the system integrates pulse I-V functions, oscilloscope and pulse measurement functions, etc.
Powerful software: Equipped with Clarius TM GUI-based software, it provides clear measurement and analysis functions, with a tree-structured project design, allowing users to adjust and modify the test sequence without programming. It also has automatic data display, algorithm analysis and real-time parameter extraction functions. The software includes over 450 application tests, helping users quickly start testing.
