Product Description:
4200-SMU keithley 4200-SMU analysis system
4200-SMU Medium Power Source Measuring Unit * 4210-SMU High Power Source Measuring Unit * 4200-PA Remote preamplifier option for 4200-SMU and 4210-SMU * 4200-SCP2 dual channel oscilloscope card * 4200-SCP2HR 200MS dual channel oscilloscope card Ultra fast I-V application kit: * 4225-PMU ultra fast I-V module
Intuitive, point-and-click Windows operating environment * * remote preamplifier, Extends SMU resolution to 0.1fA* New pulse and pulse I-V capabilities for advanced semiconductor testing * New oscillographic card with integrated oscillographic and pulse measurement capabilities * Built-in PC provides fast test setup, powerful data analysis, charting and printing, and large storage of test results * * Browser-style software interface, Scheduling tests according to the type of device allows multiple tests to be performed and provides test sequence and loop control functions
Built-in Stress/Measure, loop and data analysis, reliability testing with a mouse click, Sample tests including 5 JEDEC specifications * Support a wide range of peripherals including Keithley Type 590 and Agilent Type 4284/4294 C-V instruments, Keithley switch matrix and Agilent 81110 pulse generators
The hardware is controlled by the Keithley Interactive Test Environment (KITE), the user test module function, can be used for external instrument control and test platform integration, is an extension of KITE functionality * including driver software, Support for CascadeMicrotech Summit 12K series, Karl Suss PA-200 and PA-300, Micromanipulator's 8860 automatic and manual probe table * supports good semiconductor model parameter extraction, Includes IC-CAP and Cadence BSIMProPlus/Virtuoso
