Product Description
The KEITHLEY 4200 (typically referred to as 4200-SCS/4200A-SCS) is a laboratory-level semiconductor characteristic analysis system launched by Keithley (now part of Tektronix), positioned as a "one-stop solution for the electrical performance characterization of semiconductor devices and materials". It is not a single instrument but a modular platform integrating source measurement, capacitance analysis, pulse testing, etc., with built-in embedded PC and professional testing software. It can achieve full-process automated testing from basic I-V/C-V measurements to ultra-fast pulse characteristics and reliability assessment, and is one of the core testing devices in the fields of semiconductor research, device development, and material study.
Core feature
I-V measurement performance: Current resolution reaches 0.1 fA (femtoampere level), voltage range is ±210V. The four-quadrant output can be adapted to the forward/reverse characteristic tests of various semiconductor devices, and can capture the weak current signals of nano-scale devices;
C-V measurement performance: Frequency range is 10mHz to 10MHz, capacitance sensitivity is 1fF (femtofarad level). It supports bias voltage scanning and can accurately extract core parameters such as the oxide layer capacitance and flat band voltage of MOS devices.
