The MAP-300 (and legacy MAP-200) series is the first photonic layer lab and manufacturing platform to be LAN Extensions for Instrumentation (LXI)-compliant, bringing the full power of Ethernet connectivity and ease of use of interchangeable virtual instrument (IVI) drivers to the optical test environment. The MAP Series platform’s industry-leading density and configurability enables test engineers to meet specific application requirements in the smallest possible footprint.
Key Features:
Applications: Testing IL/RL/Length of Optical Connectors and Cable Assemblies, Structured Cabling Solutions and Optical Splitters; Automated Test of Multifiber Assemblies such as MPO; Solutions for Both Single Mode and Multi Mode Fiber-based Devices; Verifying Continuity and Polarity of Large Multifiber Assemblies; Measuring RL of Line Cards and Receptacle-based Transponders
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