Product Description:
The Keithley 2520 Pulsed Laser Diode Test System is an integrated synchronous system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Keithley 2520 offers all the source and measurement functions needed for pulsed and continuous LIV (photocurrent-voltage) testing of laser diodes in a compact half-rack instrument. The tight synchronization of the source and measurement functions ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
There are three source and measurement circuit channels in the Keithley 2520. All three channels are controlled by a single digital signal processor (DSP), ensuring tight synchronization of source and measurement functions. The laser diode drive channel provides a current source coupled to the voltage measurement capability. In addition to current measurement capabilities, each of the two photodetector channels offers adjustable voltage bias and voltage compliance. These three channels provide all the source and measurement functions required for full LIV characterization of the laser diode prior to integration into the temperature control module.
Features:
Wide temperature setpoint range (-50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C)
Compatible with various temperature sensor inputs - thermistor, RTDs and IC sensors
Maintain constant temperature, current, voltage, and sensor resistance
Ac ohm measurement capabilities verify the integrity of the TEC
