Product Description:
The Filmetrics® F50 series can map film thickness at a rate of two points per second. The electric R-Theta stage accepts standard and custom chucks for samples up to 450 mm in diameter. This is a high life stage that performs millions of measurements in our production system!
The map mode can be polar, rectangular or linear, or you can create your own, and there is no limit to the number of measuring points. Dozens of pre-defined map modes are available.
The F50 Film Thickness Mapping system connects to the USB port of a Windows® computer and can be set up in minutes.
Different F50 instruments are distinguished mainly by thickness and wavelength range. The standard F50 is the most popular. Typically, shorter wavelengths (such as F50-UV) are used to measure thinner films, while longer wavelengths allow thicker, coarser, and more opaque films to be measured.
Features:
Integrated spectrometer/light source unit
Optical cable
4 inch, 6 inch and 200 mm wafer reflection standard
TS-SiO2-4-7200 thickness standard
BK7 reflectance standard
Flat filter (for high reflective substrate)
Vacuum pump
