Product Description:
Titan cubed G2 60-300 Ultra-high resolution, easy to achieve atomic level resolution, equipped with Super X spectroscopy system, can perform rapid point, line and surface composition analysis of micro-regions, widely used in materials science, life science, semiconductor and nanotechnology fields. And equipped with in-situ loading force, heating, electricity, gas, liquid and three-dimensional reconstruction sample rod.
Technical parameters:
Acceleration voltage: 300 kV (80KV)
TEM point resolution: 80 pm
STEM resolution: 136 pm
Electron gun energy resolution: ≤ 0.7eV
Objective current stability: < 0.2ppm /min
EDX Energy resolution: 129 eV (Mn-Ka)
Lorentz mode resolution: 2.5 nm
Scope of application:
Micromorphology and structure analysis of solid materials
Electron diffraction image analysis
High resolution image analysis
EDX Spectrum Analysis (Point, line, plane)
Three-dimensional structure analysis
Analysis of magnetic domain structure
Multi-phase and multi-field (force, heat, electricity, gas, liquid) in-situ experiment
