产品描述：
4225-PMU 型超快速 I-V 模块是 4200-SCS 型半导体表征系统不断增长的仪器选件系列的最新成员。它将超快速电压波形生成和信号观测功能集成到 4200-SCS 型已经很强大的测试环境中，以提供前所未有的 I-V 测试性能，极大地扩展了系统的材料、器件和工艺表征潜力。同样重要的是，它使超快速 I-V 源和测量变得像使用传统的高分辨率源测量单元 （SMU） 进行直流测量一样简单。每个插入式 4225-PMU 型模块提供两个集成源和测量通道，但在 4200-SCS 型的 9 插槽机箱中仅占用一个插槽。与竞争解决方案不同，4225-PMU 型的每个通道都结合了高速电压输出（脉冲宽度范围从 60 纳秒到直流）与同步电流和电压测量。
特点：
具有可编程定时，从60ns至DC（10ns步长），提供了高速电压输出能力
The Type 4225-PMU ultra-fast I-V module is the latest addition to the growing family of instrument options for type 4200-SCS semiconductor characterization systems. It integrates ultra-fast voltage waveform generation and signal observation capabilities into the 4200-SCS's already robust test environment to provide unprecedented I-V test performance, greatly expanding the system's material, device, and process characterization potential. Just as importantly, it makes ultra-fast I-V sources and measurements as simple as DC measurements with a traditional high-resolution source measurement unit (SMU). Each plug-in 4225-PMU module provides two integrated source and measurement channels, but occupies only one slot in the 9-slot chassis of the 4200-SCS model. Unlike competing solutions, each channel of the model 4225-PMU combines high-speed voltage output (pulse widths ranging from 60 nanoseconds to DC) with synchronous current and voltage measurements.
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