Product Description:
The source/measurement unit (SMU), such as the Keysight B1511A (Agilent), is the key measurement module of the Agilent/Keysight B1500A semiconductor device parameter analyzer. SMU integrates voltage/current source and measurement functions into a single module, enabling accurate DC current-voltage (IV) measurements at resolutions as low as fA / μV. If you need higher measurement performance, you can extend the low current measurement performance to the sub-fA level with the optional ASU (Atto Sensing Switching Unit).
The B1511A can also perform quasi-static capacitance voltage (QS-CV) measurements. This is a measurement method to obtain low-frequency CV characteristics, and it is important to characterize the surface state of the transistor gate as well as the high-frequency CV. The Keysight B1500A achieves accurate QS-CV measurement with leakage current compensation.
In addition to the analysis and data management capabilities of EasyEXPERT software, it can characterize semiconductors, nanodevices such as carbon nanotubes (CNT) and carbon nanowires (CNW), active/passive components, materials, and any electrical device that requires accurate and precise voltage/current measurement.
Features:
MPSMU - Range up to 100 V/100 mA, 4 quadrant operation
Minimum measurement resolution 10 fA / 0.5 μV
Minimum source resolution 50 fA / 25 μV
The maximum pulse width is 2 s
Support for optional ASUs (atto-sense and switching units) extends the range to the 1pA range with a measurement resolution of 0.1fA
