Product Description:
Hitachi U-4100 offers high performance, dual beam, dual grating spectral system features for the UV-Vis-NIR region - provides great flexibility for the evaluation and quality control of various optical components in the wavelength range 175-2600 nm - available in prism/grating or grating/grating dual grating system configurations, Available with standard (200 x 200 mm) or large sample components.
Features:
The U-4100 spectrophotometer covers a wavelength range of 175 to 2600nm
The double beam design improves the accuracy and stability of the measurement, and is suitable for the spectral performance test of various complex samples.
Support transmission, specular reflection and diffuse reflection and other measurement modes to meet the test needs of different samples
Equipped with a highly sensitive integrating sphere, it is suitable for highly accurate transmission and reflectivity measurements of solid samples
