Product Description:
Bruker's Dimension Icon brings the highest level of performance, functionality and AFM accessibility to nanoscale researchers in science and industry. It is built on the world's most widely used large sample AFM platform and is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility. The system has been carefully designed from top to bottom to deliver revolutionary low drift and low noise, enabling users to obtain artefact free images in minutes instead of hours. With a growing catalog of hardware and software extensions, researchers can use this unmatched performance in the widest range of applications, supporting even the most advanced and innovative research goals.
Features:
The 8-inch wafer-vacuum sucker is capable of holding samples of all shapes and sizes up to 15 mm thick
90 micron x 90 micron x 12 micron XYZ closed loop scanner, less than 15 points
ScanAsyst terrain mode with automatic parameter adjustment
PeakForce QNM for rapid nanomechanical imaging
PeakForce TUNA for combining conductive AFM with nanomechanical mapping
