产品描述：
器件的集成度越来越高，要对它们进行全面的性能表征，必须采用完整的射频和微波测量解决方案。 E5080B 具有高达 53 GHz 的频率范围和先进的测试功能，可以为研发人员提供灵活的测试能力。 出色的动态范围、迹线噪声和温度稳定度确保其测量结果非常可靠、可重复性高。
特点：
宽广的频率范围――从 9 kHz 至 4.5/6.5/9/14/20 GHz，或从 100 kHz 至 26.5/32/44/53 GHz
140 dB 的宽广动态范围使其能够完整捕获器件性能
内置直流电源、偏置 T 型接头、脉冲发生器和脉冲调制器等选件使其能够执行完整的器件表征
使用与高端 PNA 相同的用户界面（UI）和 SCPI 命令，在研发阶段与生产阶段之间实现始终一致的测试
一台仪器即可提供频谱分析、脉冲射频测量、矢量混频器测量、噪声系数测量等多种功能，显著提高测量吞吐量
Description:
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 20 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
Features：
Wide frequency coverage from 9 kHz to 4.5/6.5/9/14/20 GHz
Fully capture device performance with a wide dynamic range of 140 dB
Achieve complete device characterization with optional built in DC sources, bias tees, pulse generators and pulse modulators
Consistently test between R&D and production with the same UI and SCPI commands as high-end PNAs.
Improve throughput by performing spectrum analysis, pulsed-RF measurements, vector mixer measurements, noise figure, and more on a single instrument
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