2520 型脉冲半导体激光管测试系统是一个集成的同步系统，用于在制造过程的早期测试半导体激光管，此时无法轻松实现适当的温度控制。2520 型在一台紧凑的半机架式仪器中提供了半导体激光管脉冲和连续 LIV（光电流电压）测试所需的所有源和测量功能。源和测量能力的紧密同步确保了高测量精度，即使在脉冲宽度短至 500ns 的情况下进行测试也是如此。
LIV 测试能力
2520 型可以执行高达 5A 的脉冲 LIV 测试和高达 1A 的连续 LIV 测试。其脉冲测试能力使其适用于测试各种半导体激光管，包括用于拉曼放大器的泵浦激光器设计。该仪器能够在同一器件上执行直流和脉冲 LIV 扫描，简化了热瞬变对半导体激光管 LIV 特性影响的分析。
最大限度地提高吞吐量并消除生产瓶颈
通过与领先的半导体激光管制造商合作，Keithley 专门设计了 2520 型，以提高芯片级和棒状测试台的产量和吞吐量。其集成设计、易用性、高速和高精度提供了完整的解决方案，可帮助半导体激光管制造商满足其生产计划。半导体激光管生产商一直面临着提高测试吞吐量和优化用于生产测试的资本设备投资回报的压力。直到最近，这些生产商还被迫使用相对缓慢且笨重的测试台来测试半导体激光管的芯片和棒材级，这通常会导致生产瓶颈。
更高的分辨率，更高的产量
为了达到所需的信噪比，传统的芯片级和条形级 LIV 测试解决方案需要使用 Boxcar 平均器或修改测试系统控制软件，以允许对多个脉冲测量进行平均。这些测量的分辨率对于“扭结”测试和阈值电流计算至关重要。在早期的测试系统设计中，特别是在执行扭结测试时，模拟数字化仪的低分辨率和较差的线性度使得区分测量中的噪声和实际设备扭结变得极其困难。2520 型独特的基于 DSP 的测量方法可自动识别所测量脉冲波形的稳定区域。这意味着 2520 型仅存储脉冲中“平坦”且包含有意义数据的那部分。在脉冲的平坦部分进行的所有测量都经过平均，以进一步提高信噪比。如果需要更高的分辨率，可以对 2520 型进行编程，以执行多个脉冲和以相同脉冲幅度进行测量。通过在棒或芯片级别进行更彻底的测试，2520 型还消除了与组装然后报废与不合规二极管的模块相关的时间和成本浪费。
简单的一体化测试解决方案
2520 型提供三个通道的源和测量电路。所有三个通道都由单个数字信号处理器 （DSP） 控制，确保源和测量功能紧密同步。半导体激光管驱动通道提供电流源和电压测量功能。除了电流测量功能外，两个光电探测器通道中的每一个都提供可调节的电压偏置和电压顺从性。这三个通道提供了在集成到温控模块之前对半导体激光管进行全面 LIV 表征所需的所有源和测量功能。2520 型的集成源和测量功能无需 GPIB 命令即可使用多台独立仪器执行测试扫描，从而显著提高了吞吐量。
2520 Pulsed Laser Diode Test System
The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-currentvoltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
LIV Test Capability
The Model 2520 can perform pulsed LIV testing up to 5A and continuous LIV testing up to 1A. Its pulsed testing capability makes it suitable for testing a broad range of laser diodes, including the pump laser designs for Raman amplifiers. The instrument’s ability to perform both DC and pulsed LIV sweeps on the same device simplifies analyzing the impact of thermal transients on the LIV characteristics of the laser diode.
Maximize Throughput and Eliminate Production Bottlenecks
By working in cooperation with leading laser diode manufacturers, Keithley designed the Model 2520 specifically to enhance chip- and bar-level test stand yield and throughput. Its integrated design, ease of use, high speed, and high accuracy provides a complete solution to help laser diode manufacturers meet their production schedules. Producers of laser diodes face constant pressure to increase test throughput and optimize return on investment for their capital equipment used in production testing. Until recently, these producers were forced to use relatively slow and cumbersome test stands for testing laser diodes at the chip and bar level, which often led to production bottlenecks.
Higher Resolution for Higher Yields
To achieve the required signal-to-noise ratio, traditional chip- and bar-level LIV testing solutions have required the use of boxcar averagers or test system control software modifications to allow averaging several pulsed measurements. The resolution of these measurements is critical for the “kink” test and threshold current calculations. With earlier test system designs, particularly when performing the kink test, low resolution and poor linearity of the analog digitizer made it extremely difficult to discriminate between noise in the measurement and an actual device kink. The Model 2520’s unique DSP-based measurement approach automatically identifies the settled region of the pulsed waveforms measured. This means the Model 2520 stores only that portion of the pulse that is “flat” and contains meaningful data. All measurements made in the flat portion of the pulse are averaged to improve the Signalto- Noise ratio still further. If greater resolution is required, the Model 2520 can be programmed to perform several pulse and measure cycles at the same pulse amplitude. By making it possible to conduct more thorough testing at the bar or chip level, the Model 2520 also eliminates the wasted time and costs associated with assembling then scrapping modules with non-compliant diodes.
Simple, One-Box Test Solution
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