4156A是安捷伦的半导体参数分析仪。半导体参数分析仪是用于多种测量功能的多合一工具。半导体参数分析仪可以测量和分析许多类型的电子设备，材料，有源或无源组件，半导体或任何其他类型的电子设备的电气特性。工程师使用此测试设备监视不同类型设备中的电流和电压响应。

附加功能：

• 高分辨率/精度和范围广。I：1 fA至1 A（20 fA偏移精度），V：1 µV至200 V
• 具有DC或脉冲模式的全自动IV扫描测量，最多可扩展6个SMU
• 同步应力/测量功能，两个高压脉冲发生器单元（±40 V）
• 时域测量：60 µS可变间隔，最高10,001点
• 易于使用：类似于曲线跟踪器的旋钮扫描，自动分析功能
• 自动化：内置HP Instrument BASIC，触发I / O功能

Agilent HP 4156A是下一代精密半导体参数分析仪。您将获得最好的数字扫描参数分析仪，可靠性测试仪，强大的故障分析工具以及自动进站检查站，所有这些都可以整合到一个仪器中。

该新系列经过专门设计，可为评估您的亚微米几何尺寸设备提供前所未有的准确性和功能。使用一台灵活的仪器，您可以从材料评估和设备表征一直到最终包装的零件检查和现场故障分析，一直提高半导体质量。

Agilent HP 4156A提供了四个内置电源/监视单元（SMU），两个电压源单元（VSU）和两个电压监视单元（VMU）。Agilent HP 4156A将电流分辨率扩展到1 fA，并将精度扩展到20 fA。Agilent HP 4156A在每个SMU上使用全开尔文遥感。

您可以随时添加Agilent HP 41501A SMU和脉冲发生器扩展器，该扩展器随附有0 V / 1.6 A接地单元。该扩展器接受两个100 mA / 100 V SMU或一个1 A / 200 V SMU，以及两个特别同步的40 V / 200 mA / 1μs脉冲发生器。

设置和测量
Agilent HP 4156A可以使用许多测量单元（包括HP 41501A中的单元）执行阶梯和脉冲扫描测量以及采样（时域）测量，而无需更改连接。此外，您可以轻松执行压力测量循环测试以进行可靠性评估，例如热载流子注入和快速EEPROM测试。

通过设置页面并填充前面板按键，键盘或HP-IB（SCPI命令）中的空白来进行设置和测量。您还可以使用旋钮扫描功能立即测量和查找设置条件，这类似于曲线跟踪器操作。

显示和分析
测量和分析结果显示在彩色CRT上，您可以叠加四个图形存储器中存储的图形进行比较。许多强大的图形分析工具使您可以轻松分析和提取许多参数，例如hFE和Vth。找到参数提取条件后，即可使用自动分析功能自动获取参数。

输出和存储
设置，测量和分析数据可以通过HP-IB或串行接口输出到彩色绘图仪和打印机。您还可以将数据以MS-DOS或LIF格式保存到3英寸磁盘上。图形（HP-GL或PCL）输出文件允许您将图形传输到桌面发布软件。

重复和自动化测试
Agilent HP 4156A内置的Agilent HP Instrument BASIC控制器可以使用不带控制器的外部仪器来构建自动测量系统。多功能的触发器I / O功能可将Agilent HP 4156A与外部仪器同步。

The 4156A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.

Additional Features:

• High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1 µV to 200 V
• Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs
• Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
• Time-domain measurement: 60 µS variable intervals, up to 10,001 points
• Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
• Automation: built-in HP Instrument BASIC, trigger I/O capability

The Agilent HP 4156A is the next generation in precision semiconductor parameter analyzers. You get the best digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument.

This new family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.

The Agilent HP 4156A offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The Agilent HP 4156A extends current resolution to 1 fA and accuracy to 20 fA. The Agilent HP 4156A utilizes full-kelvin remote sensing on each SMU.

At any time, you can add the Agilent HP 41501A SMU and Pulse Generator Expander, which is supplied with a 0 V/1.6 A Ground Unit. The expander accepts two 100 mA/100 V SMUs or one 1 A/200 V SMU, and two specially- synchronized 40 V/200 mA/1 μs pulse generators.

Setup and Measurement
The Agilent HP 4156A can perform staircase and pulse sweep measurement, and sampling (time-domain) measurement using many measurement units, including units in the HP 41501A, without changing connections. Moreover, you can easily perform stress-measure cycling test for reliability evaluation such as hot carrier injection and flash EEPROM test.

Setup and measurement are made by setting up pages and filling in the blanks from front-panel keys, keyboard, or HP-IB (SCPI commands). You can also instantly measure and find setup conditions by using knob sweep capability, which is similar to curve tracer operation.

Display and Analysis
The measurement and analysis results are displayed on the color CRT, and you can superimpose stored graphics from four graphic memories for comparison. A number of powerful graphical analysis tools make it easy to analyze and extract many parameters such as hFE and Vth. Once you find the parameter extraction conditions, you can automatically get the parameter by using the automatic analysis function.

Output and Storage
Setup, measurement, and analysis data can be output via HP-IB or serial interface to a color plotter and printer. You can also save the data onto a 3-inch disk in MS-DOS or LIF format. Graphic (HP-GL or PCL) output file allows you to transfer graphics to desktop publishing software.

Repeating and Automating Tests
The Agilent HP Instrument BASIC controller built into the Agilent HP 4156A can construct an automatic measurement system using external instruments without a controller. The Agilent HP 4156A can be synchronized with external instruments by the versatile trigger I/O functions.