产品描述
Luna LWA 7000系列是一款光波元件分析仪，专为对现代光学元件和模块（尤其是光子集成电路 (PICs) 和硅光子器件）进行高速、高精度的生产测试和质量控制而设计。该系列下的具体型号为 LWA 7601-C。
该仪器采用光频域反射计 (OFDR) 技术，其核心优势在于将反射计和传输分析仪的功能集成于单一仪器。它能够通过一次测量，同步分析插入损耗 (IL) 和回波损耗 (RL) 沿光学路径的分布情况、频率响应以及长度，从而极大地降低了测试的复杂性和成本，同时提高了测试吞吐量。
得益于其极高的灵敏度与采样分辨率，它能够对光纤网络中高达500米的测量距离进行分析，同时也是分析和测试小型化、高密度PIC芯片的理想工具。
主要特点
核心测试功能：可进行回波损耗 (RL) 和插入损耗 (IL) 分析，支持对元件在反射和透射两种模式下进行扫描测试，并能追踪RL在光路长度上的分布式情况以及进行RL和IL的光谱分析。
高速高精度定位：具备快速检测和精确定位反射事件的能力，可测量长达500米的路径长度；其20微米的空间采样分辨率和高达12 Hz的扫描/采集速率，为优化生产测试提供了速度、分辨率和准确性的保障。
卓越性能参数：提供高达70 dB的RL动态范围和 -135 dB的灵敏度，能够精确测量微弱的光信号；时延测量精度可达±0.01%，中心工作波长为1546.69 nm。
灵活的测量范围：基础型号（LWA 7601-C）在反射模式下最大测量长度为100米（透射模式200米）；通过选配扩展量程选项，反射模式测量长度可扩展至500米（透射模式1000米），空间分辨率相应为80微米。
广泛的应用兼容性：适用于空间RL测试、自动化IL测试与分析、亚皮秒分辨率的时延（Skew）测量，并广泛用于测试PLC、波导器件、AWG、ROADM、滤波器、耦合器、光纤光栅等多种无源光器件。
Product Description
The Luna LWA 7000 Series is a Lightwave Component Analyzer designed for high-speed, high-precision production testing and quality control of modern optical components and modules, particularly Photonic Integrated Circuits (PICs) and silicon photonic devices. The specific model within this series is the LWA 7601-C.
The instrument utilizes Optical Frequency Domain Reflectometry (OFDR) technology. Its key advantage is the integration of reflectometer and transmission analyzer functionalities into a single unit. It can simultaneously analyze the distribution of Insertion Loss (IL) and Return Loss (RL) along the optical path, frequency response, and length in one measurement, thereby significantly reducing test complexity and cost while increasing throughput.
With its extremely high sensitivity and sampling resolution, it can analyze measurement ranges up to 500 meters in fiber networks and is also an ideal tool for analyzing and testing miniaturized, high-density PIC chips.
Key Features
Core Testing Capabilities: Performs Return Loss (RL) and Insertion Loss (IL) analysis. Supports scanning components in either reflection or transmission mode, traces distributed RL over the length of the optical path, and conducts spectral analysis of both RL and IL.
High-Speed, Precision Location: Capable of fast detection and precise location of reflective events, measuring path lengths up to 500 m. Its 20 μm spatial sampling resolution and scan/acquisition rate up to 12 Hz provide the speed, resolution, and accuracy needed for optimized production testing.
Outstanding Performance Specifications: Delivers an RL dynamic range up to 70 dB and a sensitivity of -135 dB for precise measurement of weak optical signals. Time-of-flight delay accuracy is ±0.01%, and the center wavelength is 1546.69 nm.
Flexible Measurement Ranges: The base model (LWA 7601-C) offers a maximum measurement length of 100 m in reflection mode (200 m in transmission). With an extended range option, the reflection mode range extends to 500 m (1000 m in transmission), with a spatial resolution of 80 μm.
Broad Application Compatibility: Suitable for spatial RL testing, automated IL test and analysis, skew measurement with sub-picosecond resolution. It is widely used for testing various passive optical components including PLCs, waveguide devices, AWGs, ROADMs, filters, couplers, and Fiber Bragg Gratings.
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