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求购LUNA LWA7000系列 光波分量分析仪

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紧急求购,资金齐备,坐等发货

产品参数

选件 保修时间 状态 是否计量
不保修 完好
成色 发货周期 所在地 数量
8成新 -- 深圳市 1
预算价格: 电议
更新日期:2026-03-12
联系电话:0755-86016691

*产品描述

产品描述
Luna LWA7000 系列是 Luna Innovations 推出的光波元件分析仪,核心型号为 LWA 7601‑C,基于光频域反射(OFDR)技术,主打无源光器件与光纤链路的高分辨率反射 / 透射双模测量,兼顾研发验证与量产测试,适配光子集成、硅光芯片、光模块与光纤网络检测场景。该系列以单台仪器集成反射 / 透射测量能力,采用高分辨率 OFDR 引擎,无需多设备组合即可完成分布式损耗追踪、反射事件定位与光谱分析;内置处理器与直观操作界面,支持快速扫描与自动化测试,可直接集成到产线自动化系统,提升检测效率与数据一致性
核心特点
OFDR 技术优势:空间分辨率达 20μm,零死区测量,可精准定位微小反射事件(如接头、端面缺陷);反射灵敏度高,能捕捉低至 - 100dB 的反射信号,适配高隔离度器件。
双模测量 + 多功能集成:反射 / 透射模式一键切换,同步获取 IL、RL、长度与分布式损耗数据;支持 1520–1640nm 光谱分析,适配不同波段器件测试。

其他要求

Product Description
The Luna LWA7000 series is a light wave element analyzer launched by Luna Innovations. The core model is LWA 7601-C, which is based on the optical frequency domain reflection (OFDR) technology. It mainly focuses on high-resolution reflection/ transmission dual-mode measurement for passive optical devices and fiber links, balancing both R&D verification and mass production testing. It is suitable for photon integration, silicon photonic chips, optical modules, and fiber network detection scenarios. This series integrates reflection/ transmission measurement capabilities in a single instrument, using a high-resolution OFDR engine. Without the need for multiple equipment combinations, it can complete distributed loss tracking, reflection event location, and spectral analysis. It has an internal processor and an intuitive operation interface, supporting rapid scanning and automated testing. It can be directly integrated into the production line automation system to enhance detection efficiency and data consistency.
Key features
OFDR technology advantages: Spatial resolution up to 20μm, zero dead zone measurement, capable of accurately locating tiny reflection events (such as connectors, end face defects); high reflection sensitivity, capable of capturing reflection signals as low as -100dB, suitable for devices with high isolation.
Dual-mode measurement + multi-functional integration: One-click switch between reflection/ transmission modes, simultaneously obtaining IL, RL, length, and distributed loss data; supports 1520–1640nm spectral analysis, suitable for testing devices of different wavelengths.

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