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求购LUNA Luna 6400系列 光波分量分析仪

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紧急求购,资金齐备,坐等发货

产品参数

选件 保修时间 状态 是否计量
不保修 完好
成色 发货周期 所在地 数量
8成新 -- 深圳市 1
预算价格: 电议
更新日期:2026-03-12
联系电话:0755-86016691

*产品描述

产品描述
Luna 6400 系列是美国 Luna Innovations 推出的光波元件分析仪(Lightwave Component Analyzer),基于光频域反射(OFDR)技术,用于无源光器件与光纤网络的插入损耗(IL)、回波损耗(RL)及长度 / 反射事件的高精度测量,适配研发与量产测试场景。该系列以单台仪器实现反射 / 透射双模测量,集成高分辨率 OFDR 引擎,无需多设备组合即可完成分布式损耗追踪、反射事件定位与光谱分析;核心型号为 6415(短距离高分辨率)与 6435(长距离广覆盖),可直接集成到产线自动化系统,兼顾研发验证与量产抽检效率。
核心特点
OFDR 技术优势:空间分辨率低至 20μm,零死区测量,可精准定位微小反射事件(如接头、端面缺陷);灵敏度高,能捕捉低至 - 100dB 的反射信号,适合高隔离度器件。
双模测量 + 多功能集成:反射 / 透射模式一键切换,同步获取 IL、RL、长度与分布式损耗数据;支持光谱分析(1520–1640nm),适配不同波段器件测试。
 

其他要求

Product Description
The Luna 6400 series is a lightwave component analyzer (Lightwave Component Analyzer) launched by Luna Innovations in the United States. It is based on the optical frequency domain reflection (OFDR) technology and is used for high-precision measurement of insertion loss (IL), return loss (RL), and length/reflective events in passive optical devices and fiber networks, suitable for R&D and mass production testing scenarios. This series achieves dual-mode measurement (reflection/ transmission) with a single instrument, integrates a high-resolution OFDR engine, and enables distributed loss tracking, reflection event location, and spectral analysis without the need for multiple equipment combinations; the core models are 6415 (short distance high resolution) and 6435 (long distance wide coverage), which can be directly integrated into the production line automation system, balancing the efficiency of R&D verification and mass production inspection.
Key features
OFDR technology advantages: Spatial resolution as low as 20μm, zero dead zone measurement, capable of accurately locating tiny reflection events (such as connectors, end face defects); high sensitivity, capable of capturing reflection signals as low as -100dB, suitable for high isolation devices.
Dual-mode measurement + multi-functional integration: One-click switch between reflection/ transmission modes, simultaneously obtaining IL, RL, length, and distributed loss data; supports spectral analysis (1520–1640nm), suitable for testing devices of different wavelengths.

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