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租赁安捷伦 N7788B 光学元件分析仪

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产品参数

选件 状态 设备价值 是否计量
完好 0
成色 发货周期 所在地
8成新 -- 深圳市
租赁价格: 电议
更新日期:2026-01-09
联系电话:0755-86016691

*产品描述

产品描述:
安捷伦 N7788B 是一款光元器件分析仪。N7788B 光元器件分析仪采用专有技术,可与测量光学器件偏振模色散(PMD)或差分群延迟(DGD)的标准方法 Jones-Matrix-Eigenanalysis(JME)相媲美。它能测试一系列参数,包括 DGD/PMD、偏振相关损耗(PDL)、功率 / 损耗、TE/TM 损耗、二阶 PMD、主偏振态(PSP)以及琼斯和穆勒矩阵等。
产品特点:
测量速度快:具备新型单扫描技术,可在不到 10 秒的时间内完成 C 和 L 波段的完整分析,大大提高了测试效率。
精度高:单次扫描即可达到最高精度,无需对多次扫描进行平均,减少了测量时间和误差。
抗干扰能力强:具有较强的抗光纤运动、振动和漂移能力,保证了测量结果的稳定性和可靠性。
功能丰富:支持通过 LAN 或互联网进行远程控制,方便自动化操作和故障排除;提供一系列软件驱动程序,可轻松集成到通用 ERP 系统中;支持生成 PDF 报告,且报告内容和布局可由用户配置;具备实时功率读数功能,支持非连接器组件的高吞吐量测量;还支持使用条形码扫描仪快速传输被测器件的序列号。

详细信息

Product Description:
Agilent N7788B is a type of optical component analyzer. The N7788B optical component analyzer employs proprietary technology and can rival the standard method of Jones-Matrix-Eigenanalysis (JME) for measuring the polarization mode dispersion (PMD) or differential group delay (DGD) of optical devices. It can test a series of parameters, including DGD/PMD, polarization-dependent loss (PDL), power/damage, TE/TM damage, second-order PMD, main polarization state (PSP), as well as Jones and Mueller matrices, etc.
Product Features:
Fast measurement speed: With the new single-scanning technology, a complete analysis of C and L bands can be completed in less than 10 seconds, significantly improving the testing efficiency.
High accuracy: A single scan can achieve the highest accuracy, eliminating the need for averaging multiple scans, reducing the measurement time and error.
Strong anti-interference ability: It has a strong ability to resist fiber movement, vibration and drift, ensuring the stability and reliability of the measurement results.
Rich functions: Supports remote control via LAN or the Internet, facilitating automated operations and troubleshooting; provides a series of software drivers, which can be easily integrated into general ERP systems; supports generating PDF reports, and the content and layout of the reports can be configured by the user; has real-time power reading function, supporting high throughput measurement of non-jumper components; also supports fast transmission of the serial number of the tested device using a barcode scanner.

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