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5-in-1 Comprehensive Testing: Supports AC/DC withstand voltage (ACWV/DCWV), insulation resistance (IR), ground bond (GB), and dynamic leakage current (LC/LAC/LDC) testing, covering full safety compliance needs for electronic products.
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Twin-Port Synchronous Dual-Output: Enables simultaneous withstand voltage and ground bond testing on adjacent ports, drastically reducing test time and boosting production line throughput.
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High Precision and Wide Range: Insulation resistance measurement up to 50GΩ/1000V DC, ground bond testing supporting 30A (40A/60A optional), and maximum input current of 20A, suitable for high-power device testing.
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Dynamic Leakage Current Scanning: Optional dynamic leakage current auto-scanners (e.g., A190305/A190308) support multi-point automatic testing, minimizing manual operation errors.
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Flashover Detection: Built-in flashover detection identifies electrical discharges in insulating materials caused by high electric fields, preventing misjudgment due to insufficient leakage current change rates.
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Open/Short Circuit Detection (OSC): Real-time monitoring of open or short circuit faults during testing, avoiding misjudgment of defective products and damage to test fixtures, reducing testing costs.
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Multi-Mode Measurement and Human Body Simulation: Offers four measurement modes (standard, reverse, single-ended failure standard, single-ended failure reverse) and five human body impedance simulation circuits for accurate real-world leakage current simulation.
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Large Memory and Programmable Testing: Supports 50 test steps and 100 memory groups, with 19001 safety test software enabling programmable testing, data storage, and statistical analysis.
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Flexible Interfaces and Expandability: Standard RS-232, SCANNER interfaces, and GB OFFSET fixtures, with optional GPIB, barcode scanning, and EMI Filter test fixtures, compatible with automated test systems.
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Safety Design and Compliance: Complies with EN50191 Floating high-voltage output design, with panel operation key password locking for enhanced test security.
