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销售安立 MP1800A+MU181020A+MU181040A+MU181000A 信号质量分析仪

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产品参数

选件 是否计量 发货周期 保修时间 成色
5天 90天 8成新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2025-09-20
联系电话:0755-86016691

* 产品描述

产品描述:
Anritsu MP1800A 是可扩展的插入式模块型误码率测试器(BERT),搭配 MU181020A、MU181040A、MU181000A 等模块,组成信号质量分析系统,适用于光模块、高速设备的质量评估。
主机有 6 个插槽,支持安装多种模块,采用 Windows XP GUI 系统,可通过 GPIB 和 Ethernet 远程控制,测试比特率 0.1Gbit/s 至 32.1Gbit/s,扩展后可达 64.2Gbit/s。
MU181020A 是 14.05Gbit/s 脉冲码型发生器,扩展频率并降低 16G 光纤通道测量系统成本;MU181040A 为 12.5Gbit/s 误码检测器,精准检测对应速率误码;MU181000A 与相关设备组合,实现抖动容限测试。
产品特点:
高质量信号输出:PPG 模块输出信号抖动低、质量高、振幅大,上升 / 下降时间 12ps,峰峰值抖动 8ps,幅度达 3.5Vp-p,助力调制器测试与生产。
高灵敏度误码检测:ED 模块输入灵敏度 10mV,带时钟恢复功能,可测低振幅设备,辅助相关测试与无时钟设备 BER 测量。
丰富抖动测试:能生成多种抖动,最高 2000UI 宽幅 SJ,250MHz 下 1UI SJ,固有抖动低至 275fs(rms),保证低抖动幅度测量精准。

详细信息

Product Description:
The Anritsu MP1800A is an expandable plug-in module-based bit error rate tester (BERT). When combined with modules such as MU181020A, MU181040A, and MU181000A, it forms a signal quality analysis system, suitable for quality assessment of optical modules and high-speed equipment.
The main unit has 6 slots and supports the installation of various modules. It uses the Windows XP GUI system and can be remotely controlled via GPIB and Ethernet. It can test bit rates ranging from 0.1 Gbit/s to 32.1 Gbit/s, and can reach 64.2 Gbit/s when expanded.
MU181020A is a 14.05 Gbit/s pulse code generator, which expands the frequency and reduces the cost of the 16G optical channel measurement system; MU181040A is a 12.5 Gbit/s error detector, precisely detecting errors at the corresponding rate; MU181000A, when combined with related equipment, realizes jitter tolerance testing.
Product Features:
High-quality signal output: The PPG module outputs signals with low jitter, high quality, and large amplitude. The rise/fall time is 12ps, the peak-to-peak jitter is 8ps, and the amplitude reaches 3.5Vp-p, which helps in the testing and production of modulators.
High sensitivity error detection: The ED module has an input sensitivity of 10mV and a clock recovery function. It can measure low-amplitude devices and assist in related tests and BER measurements for devices without a clock.
Rich jitter testing: It can generate various types of jitter, with a wide range of up to 2000UI SJ, 1UI SJ at 250MHz, and the inherent jitter is as low as 275fs (rms), ensuring accurate measurement of low jitter amplitude.

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