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求购安捷伦 E8362B PNA 系列网络分析仪

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紧急求购,资金齐备,坐等发货

产品参数

选件 保修时间 状态 是否计量
010 014 0 不保修 完好
成色 发货周期 所在地 数量
8成新 -- 深圳市 1
预算价格: 电议
更新日期:2025-08-02
联系电话:0755-86016691

*产品描述

描述:
 
E8362B 是Keysight Technologies(原安捷伦)PNA系列高性能矢量网络分析仪(VNA)的代表型号,专为射频和微波器件测试而设计。它提供10 MHz至20 GHz的频率范围,结合高精度测量能力和灵活的测试配置,广泛应用于无线通信、航空航天、国防电子及半导体等领域。
 
特点:
 
123 dB 动态范围和 <0.006 dB 迹线噪声
<26 微秒/点测量速度,32 个通道,16,001 个点
TRL/LRM 校准、晶圆上、夹具内、波导和天线测量
混频器转换损耗、回波损耗、隔离和绝对群延迟
放大器增益压缩、谐波、IMD 和脉冲射频。
高精度与宽动态范围
动态范围:>123 dB(典型值),可精确测量高隔离度器件(如滤波器、隔离器)。
低迹线噪声:<0.004 dB RMS(10 Hz IFBW),适合微小信号变化检测。
多端口测试能力
支持2端口或4端口配置(需选件),满足平衡器件、差分电路的S参数测试需求。
内置源衰减器:减少测试端口失配误差,提高测量重复性。
先进的校准与误差修正
全12项误差修正(包括串扰和方向性),支持TRL/LRM校准,适用于非同轴环境(如晶圆上测量)。
智能电子校准(E-Cal):一键完成多端口校准,大幅提升效率。
高速测试与脉冲测量
快速扫描:每秒高达800个数据点(全频段),适合产线批量测试。
脉冲射频测量:支持脉冲宽度低至100 ns,满足雷达和功率放大器测试需求。

 

其他要求

Description:
 
The E8362B is a representative model of Keysight Technologies' (formerly Agilent) PNA series of high-performance vector network analyzers (Vnas), specifically designed for the testing of RF and microwave devices. It offers a frequency range of 10 MHz to 20 GHz, combined with high-precision measurement capabilities and flexible test configurations, and is widely used in fields such as wireless communication, aerospace, defense electronics and semiconductors.
 
Features:
 
Dynamic range of 123 dB and trace noise of <0.006 dB
Measurement speed <26 microseconds per point, 32 channels, 16,001 points
TRL/LRM calibration, on-wafer, in-fixture, waveguide and antenna measurement
Mixer conversion loss, return loss, isolation and absolute group delay
Amplifier gain compression, harmonics, IMD and pulse RF.
High precision and wide dynamic range
Dynamic range: >123 dB (typical value), capable of precisely measuring highly isolated devices (such as filters and isolators).
Low trace noise: <0.004 dB RMS (10 Hz IFBW), suitable for detecting minute signal changes.
Multi-port testing capability
Supports 2-port or 4-port configuration (optional), meeting the S-parameter testing requirements of balanced devices and differential circuits.
Built-in source attenuator: Reduces test port mismatch error and improves measurement repeatability.
Advanced calibration and error correction
Full 12-item error correction (including crosstalk and directionality), supports TRL/LRM calibration, suitable for non-coaxial environments (such as measurements on wafers).
Intelligent Electronic Calibration (E-Cal) : One-click completion of multi-port calibration significantly improves efficiency.
High-speed testing and pulse measurement
Fast scanning: Up to 800 data points per second (across the entire frequency band), suitable for batch testing on production lines.
Pulse RF measurement: Supports pulse width as low as 100 ns, meeting the testing requirements of radar and power amplifiers.

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