产品描述：
4200 系列中的 4200A-SCS 是业内性能领先的电学特性参数分析仪，可提供同步 I-V 曲线测试、电容 - 电压（C-V）曲线测试和超快脉冲 I-V 曲线测量，支持多种手动和半自动晶片探测器和低温控制器，能为最新 NVRAM 技术提供支持和即用型测试。
特点：具备 0.01Hz 至 10Hz 频率范围，1pF 至 10nF 灵敏度，3½ 位典型分辨率，最小典型值 10fF。可通过四点同轴探头或范德堡法轻松测量电阻率，最大电流分辨率达 10aA，输入阻抗大于 10¹⁶欧姆。支持自动实时参数提取、数据绘图和分析函数，搭配 Clarius + 分析套件，有 200 多项预先配置的测试。
特点：
具备 0.01Hz 至 10Hz 频率范围，1pF 至 10nF 灵敏度，3½ 位典型分辨率，最小典型值 10fF。可通过四点同轴探头或范德堡法轻松测量电阻率，最大电流分辨率达 10aA，输入阻抗大于 10¹⁶欧姆。支持自动实时参数提取、数据绘图和分析函数，搭配 Clarius + 分析套件，有 200 多项预先配置的测试。
Product Description:
The 4200A-SCS in the 4200 series is the industry's leading electrical characteristic parameter analyzer with outstanding performance. It offers synchronous I-V curve testing, capacitance-voltage (C-V) curve testing, and ultra-fast pulse I-V curve measurement. It supports multiple manual and semi-automatic wafer detectors and low-temperature controllers, and can provide support for the latest NVRAM technology and ready-to-use tests.
Features: It has a frequency range of 0.01Hz to 10Hz, a sensitivity of 1pF to 10nF, a typical resolution of 3½ digits, and a minimum typical value of 10fF. Resistance can be measured easily using a four-point coaxial probe or the Van der Pauw method, with a maximum current resolution of 10aA and an input impedance greater than 10¹⁶ ohms. It supports automatic real-time parameter extraction, data plotting, and analysis functions. When paired with the Clarius + analysis suite, there are over 200 pre-configured tests.
Feature:
It has a frequency range of 0.01Hz to 10Hz, a sensitivity of 1pF to 10nF, a typical resolution of 3½ digits, and a typical minimum value of 10fF. The resistivity can be easily measured using a four-point coaxial probe or the Van der Pauw method. The maximum current resolution is 10aA, and the input impedance is greater than 10¹⁶ ohms. It supports automatic real-time parameter extraction, data plotting and analysis functions. When paired with the Clarius + analysis suite, there are over 200 pre-configured tests.
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