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求购是德科技 M8040A 误码仪

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紧急求购,资金齐备,坐等发货

产品参数

选件 保修时间 状态 是否计量
不保修 完好
成色 发货周期 所在地 数量
8成新 -- 深圳市 1
预算价格: 电议
更新日期:2025-06-18
联系电话:0755-86016691

*产品描述

M8040A 是是德科技(Keysight)推出的一款 64 GBaud 高性能比特误码率测试仪(BERT),主要用于物理层表征和一致性测试。它支持 PAM4 和 NRZ 信号,可满足服务器、计算、数据中心和通信等行业中,数据速率高达 32 GBaud 和 64 GBaud 的芯片、器件、收发信机模块等相关设备的测试需求。

特点

数据速率范围广:支持 2 至 64 GBaud 的 PAM4 信号数据速率,以及 NRZ 信号,能覆盖多种高速数字接口标准的测试,如 PCIe 6.0/5.0/4.0、400 GbE 等。

信号质量高:跳变时间短,固有抖动低,可提供纯净的 NRZ 和 PAM4 信号,确保测试结果的准确性和可重复性。

具备实时误码检测:拥有真正的实时 PAM4 误码检测能力,数据速率高达 58 GBaud,可精确分析低误码率情况。

内置多种功能:包括去加重、分析仪均衡和时钟恢复功能,可有效补偿信号传输中的损耗和失真。

抖动注入功能丰富:整合和校准过多种抖动注入,如 RJ、PJ1、PJ2、SJ、BUJ 和时钟 / 2 抖动等,可模拟不同的干扰情况,用于测试设备在各种抖动条件下的性能。

双码型发生器通道:每个模块有两个码型发生器通道,可用于仿真干扰源通道,便于研究信号之间的串扰和干扰影响。

码型生成方式多样:可以通过算法生成 PRBS、QPRBS 码型,也可使用保存在存储器中的码型或是通过码型序列发生器生成码型,还支持 PAM4、Gray 编码、FEC 编码、预编码器和误码分布分析,满足不同测试场景对码型的要求。

支持多种标准测试:可对众多流行的互连标准进行接收机(输入)测试,涵盖了以太网、光纤通道、PCI Express 等多种标准,应用范围广泛。

可升级性:所有选件和模块均可升级,方便用户根据未来的测试需求扩展仪器的功能,保护用户的投资。

测试点接近被测器件:远程前端和 1.85 mm 短电缆设计,使测试点能尽量接近被测器件,减少有损通道造成的信号衰减,提高测试精度。

其他要求

The M8040A is a 64 GBaud high - performance Bit Error Rate Tester (BERT) launched by Keysight. It is mainly used for physical layer characterization and compliance testing. It supports PAM4 and NRZ signals and can meet the testing requirements of chips, devices, transceiver modules and other related equipment with data rates up to 32 GBaud and 64 GBaud in industries such as servers, computing, data centers and communications.
 
Features
 
Wide data rate range: It supports PAM4 signal data rates from 2 to 64 GBaud and NRZ signals, covering the testing of various high - speed digital interface standards such as PCIe 6.0/5.0/4.0, 400 GbE, etc.
 
High signal quality: With short transition times and low intrinsic jitter, it can provide pure NRZ and PAM4 signals, ensuring the accuracy and repeatability of test results.
 
Real - time error detection: It has true real - time PAM4 error detection capability with a data rate of up to 58 GBaud, enabling precise analysis of low bit error rate situations.
 
Built - in multiple functions: It includes de - emphasis, analyzer equalization and clock recovery functions, which can effectively compensate for signal losses and distortions during transmission.
 
Rich jitter injection functions: It integrates and calibrates various jitter injections such as RJ, PJ1, PJ2, SJ, BUJ and clock/2 jitter, etc., which can simulate different interference situations and be used to test the performance of devices under various jitter conditions.
 
Dual pattern generator channels: Each module has two pattern generator channels, which can be used to simulate interference source channels, facilitating the study of crosstalk and interference effects between signals.
 
Diverse pattern generation methods: Patterns such as PRBS and QPRBS can be generated through algorithms, or patterns stored in the memory can be used, or patterns can be generated through a pattern sequence generator. It also supports PAM4, Gray coding, FEC coding, pre - encoder and error distribution analysis, meeting the pattern requirements of different test scenarios.
 
Supports multiple standard tests: It can perform receiver (input) tests on many popular interconnection standards, covering a wide range of standards such as Ethernet, Fibre Channel, PCI Express, etc., with a wide application range.
 
Upgradability: All options and modules can be upgraded, enabling users to expand the functions of the instrument according to future testing needs and protecting users' investment.
 
Test points close to the device under test: The remote front - end and 1.85 mm short cable design allow the test points to be as close as possible to the device under test, reducing signal attenuation caused by lossy channels and improving test accuracy.

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