Product Description:
The SMU integrates the voltage/current source and measurement functions into one module, enabling accurate DC current-voltage (IV) measurements with resolution as low as fA/μV. If you need more measurement performance, the low-current measurement performance can be extended to the sub-fA level with the optional ASU (Atto Induction Switching Unit).
The SMU can also perform quasi-static capacitive voltage (QS-CV) measurements. It is a measurement method to obtain low frequency CV characteristics, which is of great significance for characterizing the surface state of transistor gate and high frequency CV characteristics.
Product Features:
The 4-quadrant power supply and measurement capabilities range from 0.1 fA − 1 A / 0.5 µV − 200 V, enabling accurate current-voltage (IV) characterization
Point, scan, pulse and sample measurement functions for a variety of measurements
The minimum sampling measurement interval is 100 μs, and the minimum pulse width is 500 μs
Quasi-static capacitive voltage (QS-CV) measurement with leakage current compensation
