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销售EXFO A0040A 光噪声分析仪

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产品参数

选件 是否计量 发货周期 保修时间 成色
5天 - 全新
所在地 机身号 状态 资料下载
- 完好
更新日期:2025-01-20
联系电话:0755-86016691

* 产品描述

产品概述:

SYCATUS A0040A光噪声分析仪是SYCATUS公司提供的一款以功率谱密度形式测量光频率噪声的先进测试设备。该分析仪集成了SYCATUS的独创技术和是德科技的X系列信号分析仪,为光频率噪声的测试提供了全面的解决方案。

产品特点:

测量精度:A0040A光噪声分析仪能够以功率谱密度形式精确测量光频率噪声,提供完整、可重复的测试结果。
噪声分析:该分析仪支持白噪声、洛伦兹线宽和1/f噪声分析,能够轻易提取白噪声部分,并计算出洛伦兹线宽。
寄生噪声检测:A0040A能够探测由Dither和EMI引起的寄生噪声,这对于ITLA等高性能激光器的研发和生产至关重要。
激光线宽仿真:该分析仪还具备传统干涉仪的激光线宽仿真功能,可以根据测量得到的光频率噪声谱计算出线宽。
内置延时自外差干涉仪:A0040A内置延时自外差干涉仪,支持传统方式的线宽测量,无需额外的参考激光源和频率调谐。
测量速度:相比以前的版本,A0040A的测量时间减少了40%,提供了更高效的测试体验。

详细信息

Product Overview:

The SYCATUS A0040A optical Noise analyzer is an advanced test device from SYCATUS that measures optical frequency noise in the form of power spectral density. The analyzer integrates SYCATUS 'original technology with Keysight's X-series signal analyzer to provide a comprehensive solution for the measurement of optical frequency noise.

Product features:

Measurement accuracy: The A0040A optical noise analyzer accurately measures optical frequency noise in the form of power spectral density, providing complete and repeatable test results.
Noise analysis: The analyzer supports white noise, Lorentz line width and 1/f noise analysis, making it easy to extract the white noise portion and calculate the Lorentz line width.
Parasitic noise detection: The A0040A is capable of detecting parasitic noise caused by Dither and EMI, which is essential for the development and production of high-performance lasers such as ITLA.
Laser linewidth simulation: The analyzer also has the laser linewidth simulation function of traditional interferometers, which can calculate the linewidth based on the measured optical frequency noise spectrum.
Built-in Delay self-heterodyne interferometer: The A0040A built-in delay self-heterodyne interferometer supports traditional line width measurement without additional reference laser sources and frequency tuning.
Measurement speed: The A0040A reduces measurement time by 40% compared to previous versions, providing a more efficient test experience.

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